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  • 1
    Electronic Resource
    Electronic Resource
    Fast-scanning shear-force microscopy using a high-frequency dithering probe (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 4274-4276 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have demonstrated high-speed scanning shear-force microscopy using a fiber tip attached to quartz crystal vibrating at 2.0 MHz resonance frequency. With a high-frequency dithering probe, we have obtained clear images at the scanning speed of 1.2 mm/s and it takes only 0.5 s to image the surface area of 55 μm2 for 64×64 pixels without any compromise of spatial lateral resolution. This speed is more than five times faster than that obtained by other topographic imaging methods and can be further improved to realize real-time shear-force probe microscopy. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1334646
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Direct observation of self-focusing near the diffraction limit in polycrystalline silicon film (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 856-858 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present direct observation of self-focusing near the diffraction limit by measuring the beam-spot size with a scanning fiber probe tip. We have used the polycrystalline silicon film, which exhibits a reverse-saturation (Im χ(3)(approximate)8×10−3 esu) and self-focusing (Re χ(3)(approximate)2×10−2 esu), as measured by the conventional z-scan method with He–Ne laser. It is observed that the beam radius of about its wavelength becomes smaller as the input laser intensity is increased, which indicates that the self-focusing effect dominates over the reverse saturation in the 300-nm-thick sample. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1335845
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    Paper (German National Licenses)
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