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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 5 (1976), S. 36-40 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Depth distributions of X-ray production by electrons in the energy range of six to fifteen key have been measured for Si and Cu characteristic X-rays in matrices of Al, Ni, Ag and Au. Corrections from these curves show that the modified Philibert absorption correction predicts the wrong dependence on matrix atomic number at these low electron energies, while the Duncomb and Reed atomic number correction shows too strong a dependence on atomic number. The curves should be valuable for comparison with both theoretical and empirical models for quantitative analysis at low energies.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 7 (1978), S. 26-30 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: From an extensive series of measurements of φ(ρz) curves, at electron energies between 6 and 15 KeV, an empirical formula;φ(R)=DKn(KR)n-1 exp(-(KR)n) where R=ρz+ρzo, was developed to accurately describe the shape and magnitude of the measured curves. On the basis of this equation a quantitative correction for absorprion and atomic mumber effects has been derived for low electron energies. A comparision of quantitative analysis using the above equation wit other absorption and atomic number corrections shows better agreement between calculated and known concenequation to a correction for fluorescence due to characteristic lines is outlined.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
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