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  • 1
    Electronic Resource
    Electronic Resource
    Relative secondary-electron yields from clean metals under fast-atom bombardment and angle-integrated UV-photoelectron spectra in a photoelectron spectromicroscope (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 2837-2843 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: This article describes the construction and operation of a source of 2–5 keV argon atoms for use in the strong (1–7 T) B-field environment of a photoelectron spectromicroscope. The velocity spread of the atom beam has been determined from the time of flight. Atom-induced secondary-electron yield measurements on selected areas of various metallic elemental samples are described and the results show that yields differ by up to a factor of 4×103 between elements and trend towards lower yields with increasing atomic number. A number of ultraviolet photoelectron spectra of the fast-atom sputter-cleaned sample surfaces are also presented. These spectra are angle-integrated over the full 2π of electron-emission angles.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144624
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Image bandpass filter in photoelectron spectromicroscopy (1988)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 45-48 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design and construction of an imaging bandpass electron energy analyzer which operates in the intermediate magnetic field of a photoelectron spectromicroscope is described. Image electrons injected parallel to the magnetic field are guided, using crossed magnetic and nonuniform electrostatic fields, to a low-pass electron mirror and subsequently a high-pass retardation filter. The nonuniform electrostatic fields compensate for the energy-dependent dispersion of the crossed fields. A bandwidth-limited photoelectron image demonstrates the spatial integrity of the image after passage through the image bandpass filter. The performance of the device as an energy analyzer is assessed. An energy resolution of less than 30 meV is demonstrated and thermionic electron spectra are presented with electron energies ranging from 10 to 200 eV with a 250-meV bandwidth. Area-selected photoelectron spectra from Au and W show UPS and XPS performance of the device. In the case of Au, the spectrum was obtained from a 400-×400-nm area.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140016
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    New imaging bandpass electron energy analyzer (1986)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 1494-1500 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An electron energy analyzer which acts as a bandpass filter while maintaining the spatial integrity of an electron image in a uniform magnetic field is described. It embodies some new electron-optical properties. Image electrons injected parallel to the magnetic field are guided, using crossed electrostatic and magnetic fields, to a low-pass electron mirror and then through a high-pass retardation filter. Nonuniform electrostatic deflection fields are used to compensate for the energy-dependent dispersion of the crossed fields. A simple computer modeling method used to design the electrostatic fields is described. A test analyzer was constructed to operate in a 0.0125-T (125 G) uniform magnetic field to investigate its properties. Bandpass filtered images of an 18-eV electron source demonstrating the removal of energy-dependent dispersion and the narrowing of the bandwidth to 100 meV are presented. Another application of the analyzer, to obtain an energy spectrum from a spatially extended electron source, is demonstrated.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138574
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Soft X rays and fast atoms as image generators in photoelectron microscopy (1983)
    [s.l.] : Nature Publishing Group
    Nature 303 (1983), S. 599-601 
    Details
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] Operation of a thermionic emitter-X-ray source, in the high magnetic field (-7 T) used by us/displays some unusual features and advantages connected with the possibility of using flux guidance of the exciting electron beam. This topic will be fully described elsewhere. In brief, X rays were ...
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1038/303599a0
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    Paper (German National Licenses)
    Fulltext
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