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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 6213-6223 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The process of atomic transport in the silicide during oxidation of silicide layers formed on Si substrates has been analyzed by means of implanted inert markers. The results confirm that CrSi2 oxidizes via the diffusion of Cr atoms towards the Si substrate, and reveal that the same type of transport occurs in VSi2, which is in opposition to the growth of these disilicides that proceeds via Si motion. Moreover during the oxidation of both VSi2 and CrSi2, the diffusing metal atoms are accompanied by a large proportion of the Si atoms from the silicide which also diffuse towards the substrate. Thus, the experimental evidence now available reveals that all the silicon-rich silicides, in increasing atomic numbers from TiSi2 to NiSi2, oxidize with the formation of metal-free SiO2 in a process that involves the diffusion of both metal and Si regardless of the predominant moving species during silicide formation. In CrSi2, VSi2, as well as TiSi2, with similar structures, examination of the structure shows that diffusion should occur via a vacancy mechanism. The thermodynamic conditions that prevail during oxidation lead indifferently to metal diffusion in one direction or Si diffusion in the other. Any selection between one mechanism or the other has to be dictated by kinetic conditions relating to the relative mobilities of the two atomic species. What is known about this is discussed in detail. Finally it is proposed that the observed dual, parallel diffusion of metal and Si, results from the very nature of the oxidation process which modifies the chemical potential of the atoms at the surface being oxidized. Thus is created a force that drives some of the atoms away from the surface, into the inside of the samples. The best known example of this behavior is the often observed "injection'' of interstitials during Si oxidation, but a similar process is at work in silicide oxidation, with somewhat similar results. Volume effects, thought to play an important role in solid state chemical reactions, are remarkably well illustrated by the oxidation of silicides.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 781-787 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design, characterization, and applications of a novel charge integrating pulsed current-voltage I(V) measurement are described. Tunneling transport through thin metal-oxide-semiconductor capacitors is measured over ten orders of magnitude of current. Short pulse widths (〈1 μs) allow electrical characterization of these films under high current densities without significant charge injection. A study of the quantum interference of electrons during Fowler–Nordheim (FN) conduction is used to illustrate the measurement.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 2555-2563 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We apply a new pump-probe charge integrating measurement technique for studying the emission kinetics of traps in the M/SiO2/Si system. Essentially, a metal-oxide-semiconductor (MOS) capacitor is pumped by exposure to a charging pulse. The emission of the charge at short time scales (〈10 ms), is measured using a delayed application of a probe pulse, that determines the remainder of the filled traps as a function of delay time. For MOS capacitors fabricated on p-Si(111) and (100) substrates, we observe trap interaction that is dramatically reduced by post-metallization annealing. Based on the effects of Si doping levels and oxide thickness, the oxide-Si interface region is shown to dominate the trap emission kinetics. A model for the trap interaction phenomena is proposed based on a perturbation of the emission cross section of the probed traps due to the presence of another state in communication with the trap site.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 62 (1993), S. 3123-3125 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new method for the study of charge emission from electrically active traps is described. This technique uses a sequence of electrostatic pulses in a pump-probe sequencing scheme, to examine the detrapping kinetics of states in the Si/SiO2 metal oxide semiconductor system. We show that with the pump-probe technique, the initial time regime of the trap emission dynamics is accessed. The results observed on oxidized lightly doped p-Si(111) substrates show trap interaction at high injection bias, and detrapping kinetics are discussed in the context of an occupation dependent trap interaction model.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Langmuir 11 (1995), S. 2689-2695 
    ISSN: 1520-5827
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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