Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
60 (1992), S. 1564-1566
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The low-energy (100 eV) hydrogen-ion bombardment effects on a-SiO2 have been investigated by using synchrotron radiation photoemission spectroscopies. The argon bombardment effects have also been studied, in order to discriminate between physical and chemical characters in the hydrogen/a-SiO2 interaction. Our results show that hydrogen treatment produces predominantly Si-H defects, which are observed to induce gap states in a-SiO2.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.107252
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