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Magnetic-field-induced anomalous microwave response in superconducting YBa2Cu3O7−δ thin films (2000)

Rao, X. S. ; Ong, C. K. ; Feng, Y. P.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 77 (2000), S. 2897-2899

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: The magnetic-field-induced decrease of microwave surface impedance, Zs=Rs+jXs, of superconducting YBa2Cu3O7−δ thin films is investigated using a microstrip resonator technique. Through measuring Zs as the direct current (dc) magnetic field is increased from zero to a certain value Hmax and subsequently decreased back to zero, it is found that Zs(Hdc) is totally reversible if Hmax does not exceed the threshold field H*, at which Rs shows a minimum, while it is irreversible if Hmax is larger than H*. It is confirmed that the anomalous effect happens in a vortex-free state. The threshold field H* is identified with the lower critical field for the vortices penetrating into the superconducting thin films. The anomalous effect is believed to be mainly contributed by the imperfect microstructure of the superconducting thin films. © 2000 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1320862

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The Anomalous Unloaded Quality Factor Behavior of High Tc Superconducting Microstrip Resonator in Weak dc Magnetic Field (2000)

Jin, B. B. ; Rao, X. S. ; Tan, C. Y. ; [et al.]

Springer

Journal of superconductivity 13 (2000), S. 85-88

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ISSN: 1572-9605

Keywords: microstrip resonator ; quality factor ; coupled-grain model ; Coffey-Clem model ; high T c superconductor

Source: Springer Online Journal Archives 1860-2000

Topics: Electrical Engineering, Measurement and Control Technology , Physics

Notes: Abstract This paper reports the anomalous behavior of unloaded quality factor (Q u ) of high T c superconducting (HTSC) microstrip resonator in weak dc magnetic field (B dc). The Q u behavior increases with the elevated applied B dc, but beyond the certain B dc value, decreases linearly with B dc. We speculate that this behavior may be caused by edge effect. The behavior is modeled both by the coupled-grain model accounting for a distribution of the grain dimension and Coffey-Clem model.