Electronic Resource
New York, NY [u.a.]
:
Wiley-Blackwell
X-Ray Spectrometry
23 (1994), S. 178-182
ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
A mathematical model for the estimation of the relative intensities of the escape peaks in HgI2 detectors is presented. Comparison of calculated results with experimental values for various x-ray energies shows satisfactory agreement. The method can be used to evaluate directly the sensitive thickness of an HgI2 detector through the escape to total peak intensity ratio.
Additional Material:
6 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300230408
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