Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
62 (1991), S. 1113-1114
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A current channeltron whose anode is biased at positive high voltage is used in conjunction with a lock-in amplifier to measure secondary photoelectron emission. The detector has good sensitivity, noise rejection, and produces surface x-ray absorption fine structure (XAFS) spectra with low noise-to-signal ratios. The need to modulate the photoelectron emission current can be exploited to limit the detection of photoelectrons to the sample.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1142021
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