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  • 1
    Electronic Resource
    Electronic Resource
    X-ray rocking curves from (100) and (111) CdTe grown on (100) GaAs by hot wall epitaxy (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 1309-1311 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: X-ray rocking curves of (100) and (111) oriented CdTe epilayers grown by hot wall epitaxy on (100) GaAs substrates have been measured. Our results indicate that the number of extended defects increases with thickness in (111) CdTe epilayers but decreases with thickness in (100) CdTe epilayers. The distortion of the GaAs surface induced by the CdTe epilayer is determined from comparative measurements of the rocking curve of the covered and uncovered GaAs substrate.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.101640
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Characterization of nanometer-scale epitaxial structures by grazing-incidence x-ray diffraction and specular reflectivity (1988)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 63 (1988), S. 1936-1941 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: X-ray rocking curve analysis is a powerful and nondestructive technique for the characterization of heteroepitaxial structures. Conventionally, measurements are performed in symmetrical scattering geometry using a double-crystal x-ray diffractometer but the technique can be extended to the study of very thin layers (〈200 A(ring)) by the use of glancing-incidence scattering geometry and a triple-crystal diffractometer. These structures can also be studied by the technique of total external x-ray reflectivity. This is sensitive to the electron-density profile of the heterostructure as a function of depth. By combining the above techniques we have found it possible to obtain structural information on layers as thin as 20 A(ring). Such measurements permit accurate measurement of individual layer thicknesses and interface roughnesses on the angstrom level. The lattice parameter strain can be obtained by modeling of the intensity distribution of the crystal truncation rod.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.339895
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    (305) SrTiO3 as substrate for coherently tilted epitaxial YBa2Cu3Ox thin films (1992)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 61 (1992), S. 607-609 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High Tc superconducting YBa2Cu3Ox (YBCO) thin films have been prepared on (305) SrTiO3 (STO) substrates. X-ray diffraction analysis and Rutherford backscattering experiments reveal that the c-axis of the layers is directed along the [001] STO axis. Bragg reflection measurements from YBCO lattice planes with high h, k, and l indices confirm that the film growth is epitaxial and almost single domain. For the critical current density jc(77 K) values of 2×106 and 1×103 A/cm2 have been found in the [010] and [501¯] YBCO directions, respectively.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.107851
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  • 4
    Electronic Resource
    Electronic Resource
    Homogeneity of graphite-monochromated X-ray beams (1988)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 44 (1988), S. 623-627 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The factors influencing the homogeneity of the incident X-ray beam when a graphite monochromator is applied are discussed, in particular the influence of the size and shape of the focal spot of the X-ray tube and the diffraction angle of the monochromator. Beam profiles have been measured for several commonly used X-ray tubes - with a fine or normal focus - and compared. It is shown that in certain cases the normal-focus X-ray tubes give a much broader high- intensity region of the incident beam than the fine- focus X-ray tubes.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767388002417
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  • 5
    Electronic Resource
    Electronic Resource
    The structure of the glass phase of Rb1−x(ND4)xD2PO4 (1986)
    Springer
    The European physical journal 65 (1986), S. 181-192 
    Details
    ISSN: 1434-6036
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract X-ray scattering techniques have been used to study the diffuse scattering from a single crystal of Rb1−x(ND4)xD2PO4 withx=0.65. This system has a structural glass phase at low temperatures resulting from the competing ferroelectric interactions of RbD2PO4 and antiferroelectric interactions of (ND4)D2PO4. The diffuse scattering shows a broad peak with a maximum occurring at a wavevector of about 0.3a *, and the intensity of these peaks is surprisingly different for wavevectorsq on opposite sides of the Bragg reflections. A model of the D bonding is developed which suggests that the diffuse scattering arises from the interaction between ferroelectric displacements alongc, ferroelectric displacements alongb, and transverse acoustic modes polarized alongb andc. The model accounts for the incommensurate wavevector and, qualitatively, for the intensity of the diffuse scattering around different Bragg reflections. The temperature dependence of the scattering is also measured.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01303843
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    Paper (German National Licenses)
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