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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 4274-4276 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have demonstrated high-speed scanning shear-force microscopy using a fiber tip attached to quartz crystal vibrating at 2.0 MHz resonance frequency. With a high-frequency dithering probe, we have obtained clear images at the scanning speed of 1.2 mm/s and it takes only 0.5 s to image the surface area of 55 μm2 for 64×64 pixels without any compromise of spatial lateral resolution. This speed is more than five times faster than that obtained by other topographic imaging methods and can be further improved to realize real-time shear-force probe microscopy. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 2057-2059 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We demonstrate high-speed near-field scanning optical microscopy using a tapered fiber tip that is inserted in a perforated quartz-crystal resonator. With this high-frequency dithering probe, we have obtained near-field optical images at the scanning speed of 1.3 mm/s and it takes only 0.5 s to image the surface area of 100 μm2 for 64×64 pixels without any compromise of spatial lateral resolution. As an application, we have obtained sequential scanning images of the diffusing microspheres in water, which shows slow change of the sample configuration in the time scale of several minutes. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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