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  • 1
    Electronic Resource
    Electronic Resource
    A micropipette force probe suitable for near-field scanning optical microscopy (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 4061-4065 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: In this paper it is demonstrated that glass micropipettes have unique applicability as force probes for a variety of imaging conditions and a variety of scanned tip microscopies. These probes are characterized in terms of the parameters that determine their force characteristics. Measurements are presented showing that one can readily achieve force constants of 10 N/m and it is anticipated that a reduction in this force constant by two orders of magnitude can be achieved. Such probes can be produced simply with a variety of geometries that permit a wide range of force imaging requirements to be met. Specifically, the glass micropipette probes reported in this paper are readily produced with apertures at the tip and can thus be applied to near-field scanning optical microscopy (NSOM). This opens the possibility of the long-awaited development of a universal feedback mechanism for NSOM.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143212
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Multifunctional, micropipette based force cantilevers for scanned probe microscopy (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 65 (1994), S. 648-650 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We demonstrate quartz micropipette and optical fiber based structures with unique applications for scanned probe microscopy. These probes are produced by drawing, cantilevering, and polishing tapered micropipettes and optical fibers and have significantly greater potential functionality than any other currently available scanning tip. We present normal force, contact mode imaging of a selection of surfaces, operating these probes with different commercial instruments for atomic force microscopy (AFM). With their very sharp tips, ultrahigh aspect ratios, and readily adjustable force constants and resonance frequencies, the probes present an attractive alternative to conventional microfabricated cantilevers that are currently in routine use with AFM. Bent quartz optical fiber probes also enable simple integration of near-field scanning optical microscopy and AFM.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.112259
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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