ISSN:
1608-3180
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
Notes:
Abstract It is shown that the use of formulas of paraxial optics in the spatial reconstruction of grain coordinates which are measured by a microscope with a wide-aperture objective lens in an emulsion tracker plate may lead to a systematic error. The error vanishes, if, in these formulas, a single phenomenological parameter a eff with a value lying between zero and the numerical aperture of the lens. The results of the combined analysis of a series of film thickness measurements for films with various refractive indices n allowed us to estimate a eff parameters for several lenses. With no allowance for correction, the relative systematic error is +0.6% in measurements with a TIYODA 60×/1.0 immersion lens in a plastic layer with n pl = 1.49 and –0.2% in measurements in an emulsion with n em = 1.53 with the same objective lens. Measurements with a LOMO 40×/0.65 lens yielded corresponding errors of –3.4 and –3.6%.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1026611732294
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