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  • 1
    Electronic Resource
    Electronic Resource
    On contrast parameters and topographic artifacts in near-field infrared microscopy (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 6808-6814 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Near-field microscopy overcomes the diffraction limit through the partial conversion of the evanescent fields, formed around the subwavelength sources of light, into propagating waves by interactions between the probe and the sample. Contrast parameters in this imaging technique are quite different from those in conventional (far-field) optics. We study the mechanisms of image formation in the transmission mode of a near-field microscope in the mid-infrared part of the spectrum (6–10 μm). The amount of light propagating from a subwavelength aperture through a flat substrate ("allowed" light) is found to strongly increase as the tip approaches the sample, generating topographic artifacts in near-field images. Such artifacts can be eliminated by flat sample preparation techniques. The transmitted power is strongly influenced by the refraction index of the sample resulting in a substantial difference of the near-field spectrum from the far-field one. A model describing tunneling of light through a subwavelength aperture into the substrate has been developed and is in very good agreement with the experimental data. The model predicts that spectral sensitivity is enhanced with smaller tip diameters. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1321792
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  • 2
    Electronic Resource
    Electronic Resource
    Stable pinch in the SPEED 2 plasma focus (1999)
    Springer
    Technical physics letters 25 (1999), S. 802-805 
    Details
    ISSN: 1090-6533
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Conditions of discharge generation in deuterium doped with heavy argon and xenon gases were investigated in experiments in the SPEED 2 plasma focus in the micropinch plasma compression mode and in the stable plasma formation regime. An extensive arsenal of diagnostic techniques, including spectral techniques in the soft-x-ray range with temporal, spatial, and energy resolution was used to achieve a controlled transition from one regime to another. The experimental data are consistent with the assumption that the discharge is stabilized by a gyromagnetic deuteron acceleration mechanism.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1134/1.1262641
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  • 3
    Electronic Resource
    Electronic Resource
    Production of wavelength-selective, time-resolved, x-ray images of a neon plasma in the SPEED 2 plasma focus (1997)
    Springer
    Technical physics letters 23 (1997), S. 316-318 
    Details
    ISSN: 1090-6533
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The dynamics of pinching of a neon plasma in the SPEED 2 facility has been investigated by recording wavelength-selective, x-ray images of the plasma with good space and time resolution. A series of images of the plasma focus was obtained on the λ=1.21 nm and λ=1.35 nm emission lines of hydrogen-and helium-like ions at various stages of plasma compression. The stable nature of the discharge in a neon plasma was confirmed. It was established that at the final stage of pinching, the charge of the neon ions increases rapidly from +9 to +10, and when the pinch diameter is less than 1 mm, the plasma is completely ionized.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1134/1.1261826
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    Paper (German National Licenses)
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