ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The latest developments in microwave reflectometry work at JET are described. A multichannel reflectometer system which can measure either the spatial profile of the electron density, or the propagation of rapid density perturbations, is described and some illustrative results are presented. The possible use of reflectometry as a technique for determining the total internal magnetic field is discussed and the results of an experiment to test the basis of this method are presented. Finally, a new technique, correlation reflectometry, which has been developed specifically for studying density fluctuations is described and some preliminary results are presented.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1141796
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