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  • 1
    Electronic Resource
    Electronic Resource
    X-ray diffuse scattering from a nitrogen-implanted niobium film (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 8104-8110 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A 2500-A(ring) niobium single-crystal film was deposited onto a sapphire substrate and subsequently implanted with nitrogen to an average concentration of 0.5 at. %. Synchrotron radiation was used to measure the difference between the implanted and an unimplanted film to isolate the diffuse scattering from the implanted film near two Bragg reflections. This diffuse intensity arises mainly from elastic displacement fields about radiation-damage-related loops located on (211) planes. A small contribution of the scattering is calculated from the displacements about single interstitial nitrogen in octahedral sites. The Burgers vector of the loops is along the [111¯] direction and makes an angle of 62° with the loop plane giving a dominant shear component. Vacancy loops have a radius ∼5 A(ring) while interstitials are somewhat larger ranging from 10 to 15 A(ring). The number of vacancies and interstitials are nearly the same.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.347460
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Determination of residual stress in Cr-implanted Al2O3 by glancing angle x-ray diffraction (1992)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 60 (1992), S. 2216-2218 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report x-ray diffraction measurements of residual stress in sapphire crystals implanted with Cr+ ions. Stress is determined by measuring both in-plane and out-of-plane lattice constants. Bragg peak positions are measured to determine average stress, while peak widths are measured to determine its variation. Using angles of incidence close to the critical angle for total external reflection of x rays, we compare measurements confined to within ∼2.5 nm of the surface and measurements over the ∼80 nm thickness of the implanted region. These x-ray residual stress determinations are consistent with those based on indentation crack length, but were less by a factor of 10 than reports based on cantilever bending.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.107060
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    MODERN RESONANT X-RAY STUDIES OF ALLOYS: Local Order and Displacements1 (1999)
    Palo Alto, Calif. : Annual Reviews
    Annual Review of Materials Research 29 (1999), S. 25-52 
    Details
    ISSN: 0084-6600
    Source: Annual Reviews Electronic Back Volume Collection 1932-2001ff
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The recent availability of intense synchrotron sources with selectable X-ray energies permits high-precision measurements of chemically specific atomic-pair correlations in solid-solution alloys. Short-range chemical order can be accurately measured to identify one atom in a 100 for 10 or more shells, even in alloys with elements nearby in the periodic table, and chemically specific static displacements can be measured with 0.0001 nm resolution. This new information tests theoretical models of alloy phase stability and structure and gives new insights into the physical properties of alloys.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1146/annurev.matsci.29.1.25
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Three-dimensional X-ray diffuse scattering study of local atomic arrangements in Ni4Mo (1975)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 8 (1975), S. 115-115 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: To construct a three-dimensional model of the local atomic arrangements for solid solutions, it is preferable to have X-ray diffuse scattering measurements in three-dimensional space. Two such measurements have been made on a single-crystal of Ni4Mo as quenched from 1000°C and as annealed for 5 min at 650°C.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889875009752
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    A determination of thin oxide film thickness by integrated intensity measurements (1961)
    Copenhagen : International Union of Crystallography (IUCr)
    Acta crystallographica 14 (1961), S. 569-570 
    Details
    ISSN: 0001-5520
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0365110X61001832
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    Paper (German National Licenses)
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  • 6
    Electronic Resource
    Electronic Resource
    The interpretation of intensity distributions from disordered binary alloys (1971)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 27 (1971), S. 198-201 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: X-ray diffuse scattering from disordered alloys is the primary direct source of information concerning the Warren parameters which describe the existing state of order. However, the short range order diffuse intensity is obscured by other contributions to the diffraction pattern resulting from static atomic displacements from the average lattice, and from effects related to thermal motion. Described here is a method to separate the diffraction pattern into its various components so that each may be interpreted independently. No assumptions are made about the nature of the atomic displacements δ, except that they are sufficiently small, and that the diffraction vector k/2π is sufficiently small, that terms beyond the term quadratic in k . δ may be neglected in the series expansion of exp [ik . δ].
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0567739471000469
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    Paper (German National Licenses)
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  • 7
    Electronic Resource
    Electronic Resource
    The short-range structure of copper–16 at. % aluminum (1964)
    Copenhagen : International Union of Crystallography (IUCr)
    Acta crystallographica 17 (1964), S. 827-835 
    Details
    ISSN: 0001-5520
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0365110X64002249
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    Paper (German National Licenses)
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