ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
To expand the capabilities of the microwave frequency alternating current scanning tunneling microscope to include the ability to study isolated adsorbates and highly reactive surfaces, we have developed a low temperature, ultrahigh vacuum alternating current scanning tunneling microscope. In this alternating current scanning tunneling microscope, we employ the reliable beetle-style sample approach mechanism with a number of other components unique to a low temperature scanning tunneling microscope. These include the sample transfer, delivery, retrieval, storage, sputtering, and heating systems. This alternating current scanning tunneling microscope operates at 77 and 4 K.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1144551
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