ISSN:
1432-0428
Keywords:
Insulin-mediated glucose uptake
;
glucose oxidation
;
non-oxidative glucose disposal
;
lipid oxidation
;
insulin resistance
Source:
Springer Online Journal Archives 1860-2000
Topics:
Medicine
Notes:
Summary Insulin resistance is a common feature of Type 2 (non-insulin-dependent) diabetes mellitus. This defect in insulin-mediated glucose metabolism could result from a defect in either glucose oxidation or non-oxidative glucose disposal. To examine this question, euglycaemic insulin clamp studies were performed in 16 normal weight Type 2 and 11 age-matched control subjects. In Type 2 diabetic patients the fasting plasma glucose concentration, 8.39±0.50 mmol/l, was allowed to decline (over 54±6 min) to 5.33±0.11 mmol/l before starting the insulin clamp. Total body glucose uptake was significantly decreased in Type 2 diabetic patients vs control subjects (148±15 vs 264±25 mg/min · m2, p〈0.001). Both total glucose oxidation (59±6 vs 89±6 mg/min·m2, p〈0.005) and non-oxidative glucose disposal (89±15 vs 179±24 mg/min · m2, p〈0.005) were significantly reduced in the Type 2 diabetic patients. Basal glucose oxidation was also reduced in the Type 2 diabetic patients (22±3 vs 38±5 mg/min·m2, p〈0.01). In conclusion, during the postabsorptive state and under conditions of euglycaemic hyperinsulinaemia, impairment of glucose oxidation and non-oxidative glucose disposal both contribute to the insulin resistance observed in normal weight Type 2 diabetic patients. Since lipid oxidation was normal in this group of diabetic patients, excessive non-esterified fatty acid oxidation cannot explain the defects in glucose disposal.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00264764
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