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  • 1
    Electronic Resource
    Electronic Resource
    Depth profiles of ion-implanted fluorine in tin-oxide films prepared by atmospheric-pressure chemical vapor deposition (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 4266-4269 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Depth profiles of fluorine in 19F+-implanted tin-oxide films have been accurately measured using 19F(p,αγ)16O resonance nuclear reactions at ER=872.1 keV and ER=340.46 keV. A proper deconvolution calculation method was used to extract the true range distribution of implanted fluorine from the experimental excitation yield curves. The range distribution parameters, RP and ΔRp, were thereby obtained and were compared with those obtained by Monte Carlo simulations. The experimental Rp values agree with the Monte Carlo simulation values very well, while the experimental ΔRp values are larger than those obtained theoretically. This phenomenon may be attributed to the enhanced diffusion during the ion implantation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.352806
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Reflection of light ion from solid surfaces studied by Monte Carlo simulation and transport theory (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 439-446 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The reflection from amorphous Cu and Ni surfaces of light ions, such as H+, 3He+, and 4He+ in the energy region of 0.1–10 keV, has been studied by computer simulation and transport theory. The results show that the energy distribution of the reflected particles can be approximately described by a universal empirical formula for the whole energy region, all the angles of incidence, and the different ion-target combinations studied here, and the angular distributions of the reflected particles can be described by a cosine expansion with a few terms. In the transport theory calculation of the particle and energy reflection coefficients, the energy distribution spectra of the reflected particles are used to give a realistic surface correction. The present work is compared with both experimental data and other simulation codes.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.347681
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Range distributions of ion-implanted fluorine in Hg1−xCdxTe, CdTe, and Pb1−xSnxTe (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 3269-3274 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Depth profiles of ion-implanted fluorine in Hg1−xCdxTe, CdTe, and Pb1−xSnxTe have been measured by use of the 19F(p,αγ)16O resonance nuclear reaction at 872.1 keV with width Γ=4.2 keV. In order to obtain the true range distribution of implanted fluorine from the experimental excitation yield curve, a convolution calculation method is presented, from which the range distribution parameters such as the average projected range RP, the projected range straggling ΔRP and the skewness of the projected range distribution SK were obtained. These experimental range parameters were compared with those obtained by a theoretical calculation and by use of the trim89 program, and shows that for all the materials studied here the experimental RP values agree with the theoretical and the trim values very well but the experimental range straggling ΔRP are larger than those obtained by the theoretical calculation and the trim89. This phenomenon may be attributed to the enhanced diffusion during the ion implantation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.345361
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Comparison of ion range distributions obtained by different Monte Carlo codes with different electronic stopping powers
    Amsterdam : Elsevier
    Nuclear Inst. and Methods in Physics Research, B 51 (1990), S. 11-16 
    Details
    ISSN: 0168-583X
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0168-583X(90)90532-Y
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  • 5
    Electronic Resource
    Electronic Resource
    Laser ablation of copper and aluminium in air (1991)
    Springer
    Applied physics 52 (1991), S. 425-432 
    Details
    ISSN: 1432-0630
    Keywords: 79.20 Ds
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The ablation behavior of copper alloy and aluminium irradiated in air by 1.06 μm, 10 ns pulsed laser with power density of 6.4×109W/cm2 was studied using scanning electron microscopy (SEM), MCS-RBS and X-ray microanalysis. Evidence of bulk vaporization via bubble formation was observed for the copper alloy under the laser irradiation. Silver-enrichment microregions were found in the ablation crater created by the laser shots on the copper alloy sample. Material removal rates of these materials were determined by crater shape-profile measurement. Using self-similar solutions of the gas-dynamic equations, gas-dynamic parameters of the vaporization waves are obtained. These parameters are used to calculate material removal rates and impulse coupling coefficients of these materials under the pulsed laser irradiation. The calculated mass removal rates and the coupling coefficients are compared with the corresponding experimentally determined values. The surface kinetic energy of the irradiated area on the Al sample is estimated. Possible mechanisms for laser ablation of the materials under study are discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00323654
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    Paper (German National Licenses)
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