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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 192-194 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: 50 Hz current-dependent loss measurements were carried out at 4.2 K on short straight samples of Bi2Sr2Ca1Cu2O8+x /Ag wires having high critical current densities of up to 1.5×104 A/cm2 at 26 T. The ac power losses vary proportional to the square of the transport current which is not consistent with the simple Bean model. On the other hand the losses depend linearly on the frequency of the alternating current which would be compatible with hysteresis as the dominant loss mechanism. Loss values are found to be rather high and are not strongly influenced by bias magnetic fields up to 1 T. Several effects may contribute to the loss enhancement and its current dependence, however the reason for this behavior remains to be clarified.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 2441-2443 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Bi2 Sr2 Ca1 Cu2 O8+x /Ag wires have been produced by using the "powder in tube'' method and an appropriate annealing procedure. At 77 K these wires yield critical current densities up to 1.2×103 A/cm2 in zero magnetic field. Using ac susceptibility measurements it is shown that flux creep is limiting the critical current density at temperatures above ∼20 K. At lower temperatures flux creep becomes insignificant. At 4.2 K critical current densities up to 5.5×104 A/cm2 in zero magnetic field and up to 1.5×104 A/cm2 in a field of 26 T could be achieved, rendering possible the use of this material for very high field application.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 61 (1992), S. 858-860 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The irreversible strain limit εirrev for the onset of permanent axial strain damage to Ag-sheathed Bi2Sr2Ca1Cu2O8+x and Bi2Sr2Ca2Cu3O10+x superconductors has been measured to be in the range of 0.2%–0.35%. This strain damage onset is about an order of magnitude higher than for bulk sintered Y-, Bi-, or Tl-based superconductors and is approaching practical values for magnet design. The measurements show that the value of εirrev is not dependent on magnetic field, nor does the critical current depend on strain below εirrev at least up to 25 T at 4.2 K. Both of these factors indicate that the observed strain effect in Ag-sheathed Bi-based superconductors is not intrinsic to the superconductor material. Rather, the effect is extrinsic and arises from superconductor fracture. Thus, the damage onset is amenable to further enhancement. Indeed, the data suggest that subdividing the superconductor into fine filaments or adding Ag to the superconductor powder prior to processing significantly enhances the damage threshold εirrev to above 0.6%.
    Type of Medium: Electronic Resource
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