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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 90 (2001), S. 1480-1488 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ferroelectric thin films of barium titanate were fabricated by sol–gel technique on platinum substrates. The processing temperature was 700 °C. The films obtained with a thickness of 1.5 μm were dense, transparent, and showed ferroelectricity. Scanning electron microscopy and x-ray diffraction were used for studying the surface morphology and crystallographic structure of the film. Films in the metal–ferroelectric–metal configuration (MFM) were used for the electrical measurements. Dielectric constant and loss tangent were found to be 430 and 0.015, respectively, at 10 kHz under ambient conditions. The ε′(T) curve shows broad peak centered around 120 °C as in the case of diffuse phase transition. The ac conductivity is proportional to ω0.9 in the low frequency region and ω1.8 in the high frequency region. The dc conductivity versus temperature curve showed a change in the slope around 125 °C, corresponding to the phase transition. To study the low temperature phase transitions, dielectric parameters on the films were measured to a temperature down to about 10 K. Remanent polarization (Pr) and coercive field (Ec) obtained from the hysteresis loop at room temperature are ∼2.0 μC/cm2 and ∼27 kV/cm, respectively. Capacitance–voltage studies performed on the MFM structures showed butterfly loop at 135 °C. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 4484-4488 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Strontium titanate sol was prepared using strontium ethyl haxanoate and titanium isopropoxide. The sol was then spin coated on fused silica, p-type single-crystal silicon wafers (100) and stainless-steel substrates and annealed to give polycrystalline, transparent, and crack-free films. The surface morphology and structural properties of the films were studied using scanning electron microscopy and x-ray diffraction, respectively, and differential thermal analysis was used to observe structural transition. The dielectric measurements were conducted on films with metal–insulator–metal and metal–insulator–semiconductor configurations. Capacitance–voltage (C–V) measurements were carried out and the effect of the annealing temperature was studied. The dielectric constant and loss tangent at 1 MHz at room temperature were found to be 105 and 0.02, respectively, for 1.1 μm thick films. These measurements were also carried out at low temperatures down to 20 K. There are indications for a phase transition from a cubic perovskite to tetragonal perovskite structure at about 100 K where the tan δ shows some fluctuation, a characteristic of such transitions. The absence of a peak in the dielectric constant and the absence of hysteresis below the transition temperature have been explained on the basis of the low value of the tetragonal distortion (c/a=1.003) reported on bulk material. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Science Ltd
    BJOG 110 (2003), S. 0 
    ISSN: 1471-0528
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Medicine
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Journal of sol gel science and technology 16 (1999), S. 101-107 
    ISSN: 1573-4846
    Keywords: sol-gel ; electrical properties ; barium titanate ; conduction mechanism
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract BaTiO3 thin films were prepared on single crystal silicon (1 0 0) and platinum substrates by sol-gel technique. Amorphous films with thickness uniformity were obtained by spinning the solution at 3000 rpm for 30 s and by post-deposition annealing at 400°C. The films exhibited good dielectric and insulating properties. The dielectric constant and dissipation factor at a frequency of 100 kHz were 17 and 0.20, respectively, for 1400 Å thick film on platinum substrate (MIM). The corresponding values were 16 and 0.015 for films on Si (MIS). Dielectric properties were also studied as functions of frequency and voltage. The C-V curve for MIS structure exhibited a hysteresis. The density of interface states recharged during the bias cycle in hysteresis measurement was estimated to be of the order of 2.10 × 1011 cm−2 and total oxide charge density was about 4.28 × 1011 cm−2. I-V measurements were performed on films of different thicknesses. The leakage current densities at 5 V for the films having thicknesses 1400 and 2800 Å were 0.86 and 0.11 μA/cm2 respectively. The conduction mechanism is found to be Poole-Frenkel and Schottky mechanisms at low and high fields, respectively.
    Type of Medium: Electronic Resource
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