Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
79 (2001), S. 4103-4105
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Dispersion of the ordinary and extraordinary indices of refraction have been measured systematically for wurtzitic AlxGa1−xN epitaxial layers with 0.0≤x≤1.0 throughout the visible wavelength region. The dispersion, measured by a prism coupling waveguide technique, is found to be well described by a Sellmeier relation. Discrepancies among previous measurements of refractive index dispersion, as a consequence of different growth conditions and corresponding band gap bowing parameter, are reconciled when the Sellmeier relation is parameterized not by x but by band gap energy. © 2001 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1426270
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