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  • 1
    Electronic Resource
    Electronic Resource
    Examination of the monoclinic/orthorhombic transition in silicalite using XRD and silicon NMR (1985)
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 89 (1985), S. 1070-1072 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/j100253a005
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  • 2
    Electronic Resource
    Electronic Resource
    THE TIME-DOMAIN ELECTROMAGNETIC RESPONSE OF POLARIZABLE BODIES: AN APPROXIMATE CONVOLUTION ALGORITHM (1988)
    Oxford, UK : Blackwell Publishing Ltd
    Geophysical prospecting 36 (1988), S. 0 
    Details
    ISSN: 1365-2478
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Geosciences , Physics
    Notes: It is now believed that the negative transients observed in coincident-loop transient electromagnetic (TEM) measurements are caused by polarizable bodies (bodies whose conductivity increases as a function of frequency). Ordinarily the TEM response of polarizable bodies is obtained by calculating the frequency-domain response at many frequencies and transforming it to the time domain via Fourier, Laplace or Hankel transforms. This is normally a computationally laborious task. However, for some simple non-polarizable bodies the time-domain response is analytical and can be computed easily. When these simple bodies are weakly polarizable an approximate response can be obtained by convolving the easily-calculated, non-polarizable response with the impulse response of the polarization. The approximate response is found to be very similar to the exact response for the polarizabilities normally seen in geological materials.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1365-2478.1988.tb02192.x
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  • 3
    Electronic Resource
    Electronic Resource
    Chloro- and Dichloro-bis-(trichloromethyl)-benzenes1 (1948)
    s.l. : American Chemical Society
    Journal of the American Chemical Society 70 (1948), S. 1317-1318 
    Details
    ISSN: 1520-5126
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/ja01184a008
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  • 4
    Electronic Resource
    Electronic Resource
    Chemical vapor deposition of cobalt silicide (1988)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 53 (1988), S. 740-742 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have deposited polycrystalline cobalt silicide films by chemical vapor deposition using Co2(CO)8 or HCo(CO)4 as the Co source and SiH4 or Si2H6 as the Si source. The Co:Si ratio of the films is controlled by changing the deposition temperature, and CoSi2 stoichiometry is obtained at 300 °C using SiH4 or at 225 °C when Si2H6 is the Si precursor. Carbon or oxygen contamination of the films is 〈0.5 at. % at deposition temperatures above 200 °C. Resistivities of films deposited near CoSi2 stoichiometry are typically 200 μΩ cm and drop to 40 μΩ cm upon annealing at 900 °C.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.100558
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  • 5
    Electronic Resource
    Electronic Resource
    Excimer laser-induced chemical vapor deposition of titanium silicide (1985)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 58 (1985), S. 3573-3582 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A pulsed ArF excimer laser has been used to deposit thin conductive films of titanium silicide on silicon and silicon oxide substrates. The films are deposited from a gas mixture of titanium tetrachloride and silane by initiating photochemical reactions near the heated substrate. The resistivity, composition, crystal structure, and morphology of the films vary as a function of gas composition and substrate temperature. Films deposited at 400 °C, with SiH4/TiCl4 mole ratios of ∼2, have resistivities of 300 μΩ cm, which drop to 20–30 μΩ cm on annealing at 650–700 °C. At higher deposition temperatures (450–550 °C) the films have resistivities of ∼110 μΩ cm and show similar annealing behavior. The as-deposited films are a mixture of amorphous and a metastable Ti-Si crystalline phase. On annealing they convert to polycrystalline TiSi2. Films deposited at 400–450 °C are smooth and show conformal step coverage. The film roughness increases at higher deposition temperatures.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.335733
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  • 6
    Electronic Resource
    Electronic Resource
    PHARMACOGENETICS - A FRESH APPROACH TO THE PROBLEM OF ALLERGY (1964)
    Oxford, UK : Blackwell Publishing Ltd
    Annals of the New York Academy of Sciences 118 (1964), S. 0 
    Details
    ISSN: 1749-6632
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Natural Sciences in General
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1749-6632.1964.tb33993.x
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  • 7
    Electronic Resource
    Electronic Resource
    Fréchet derivatives and single scattering theory (1989)
    Oxford, UK : Blackwell Publishing Ltd
    Geophysical journal international 98 (1989), S. 0 
    Details
    ISSN: 1365-246X
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Geosciences
    Notes: Despite their obvious importance in geophysical inversion schemes, Fréchet derivatives have previously only been studied for very simple earth models. Although these derivatives can be interpreted mathematically as sensitivity functions, the basis for this assertion is not well understood in terms of physical laws. To some extent these limitations are the result of the conventional method used to derive the derivatives. By writing the equation(s) for a linear field (potential, diffusive, wave) in an arbitrarily perturbed medium as an integral rather than differential equation, one sees that the Fréchet derivatives or related sensitivity functions for any region in a model are just an integral over Green's functions. However, Fréchet differentiability must be established and the proof of this is shown to depend on the finiteness of the fields at the boundaries of the perturbed volume. If the scattering representation is Fréchet differentiale, the Fréchet derivatives are easily given a physical interpretation in terms of scattering theory. The method is illustrated by deriving an analytical expression for the DC resistivity Fréchet derivative in a uniform halfspace and the result is compared to previously published work.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1365-246X.1989.tb03359.x
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  • 8
    Electronic Resource
    Electronic Resource
    A Generalized Representation of the Electromagnetic Fields In A Layered Earth (1989)
    Oxford, UK : Blackwell Publishing Ltd
    Geophysical journal international 97 (1989), S. 0 
    Details
    ISSN: 1365-246X
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Geosciences
    Notes: A generalized representation of the electromagnetic (EM) fields due to an arbitrary source in a layered earth is developed in terms of toroidal and poloidal modes. This modal potential representation is examined in detail and it is shown that EM Green's functions for stratified earth can always be factored into ‘geometrical’ operators and ‘electrical’ kernels. the electrical kernels represent the physical expansion of the EM field in the layered earth and are independent of the survey geometry. Conversely, the geometrical operator is independent of the earth model and represents the source/receiver configuration. the geometrical operators are essentially frequency-independent weighting functions which act on the electric kernels. Thus, changing the source-receiver geometry only serves to change the ‘window’ through which we observe the fundamental physics of the interaction of the EM fields with the layered earth. the factored representation of the EM fields is illustrated with examples from surface electrical prospecting methods.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1365-246X.1989.tb00521.x
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  • 9
    Electronic Resource
    Electronic Resource
    A spatial and spectral analysis of the electromagnetic sensitivity in a layered earth (1989)
    Oxford, UK : Blackwell Publishing Ltd
    Geophysical journal international 98 (1989), S. 0 
    Details
    ISSN: 1365-246X
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Geosciences
    Notes: A sensitivity analysis of an electromagnetic (EM) technique can illustrate its theoretical resolution and is an essential step in using linearized inversion methods. Yet previous sensitivity studies in EM methods provide only a cursory examination of the complete, non-linear problem. We present a simplified analysis which illustrates the frequency characteristics and spatial variations of the EM sensitivity to buried layers in a stratified earth. The simplifications arise from ignoring the complicated geometrical effects of the sourcereceiver configuration and examining only the two fundamental response kernels which comprise the EM fields in a layered conductive earth. In this fashion, different EM prospecting methods can be compared and contrasted without dealing with specific aspects of survey methods. It is shown that although sensitivity is non-linearly related to conductivity, it is a qualitatively predictable function of frequency and source-receiver separation. Several general conclusions concerning electroprospecting can be derived in this manner. However, in all cases the realm (in space-frequency domain) of the maximum sensitivity in any layer is relatively small, suggesting that a diverse spatial and frequency sampling of the field is required in any high-resolution EM sounding survey.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1365-246X.1989.tb05510.x
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  • 10
    Electronic Resource
    Electronic Resource
    A controlled-source, time-domain electromagnetic survey over an upthrust section of Archean crust in the Kapuskasing Structural Zone (1989)
    Oxford, UK : Blackwell Publishing Ltd
    Geophysical journal international 99 (1989), S. 0 
    Details
    ISSN: 1365-246X
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Geosciences
    Notes: A pilot controlled source electromagnetic survey was conducted in the Kapuskasing Structural Zone to test the application of the UTEM technique for determining the electrical conductivity structure of the Earth's crust to depths of up to 10 km. In general, the data are consistent with the results of an earlier broadband magnetotelluric (MT) survey and indicate a quasi-layered earth below a variable overburden zone with conductances between 0.1 and 0.5 S. At some depth below 10 km, conductivity appears to increase in agreement with the MT interpretation and provides confidence that the static shift of the MT data was corrected. A weakly conductive layer, located at depths greater than 2 km, is possibly associated with a feature of the Ivanhoe Lake Cataclastic Zone (ILCZ), a major fault zone along which up to 30 km of the Earth's crust has been thrust to the surface. There was no clear evidence in the UTEM data for a conductive zone extending to the proposed surface strike location of the ILCZ. A conductive anomaly at depths of 1–2 km may extend east of the present survey area and suggested that a subsequent UTEM survey must expand the coverage to the east.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1365-246X.1989.tb02024.x
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