ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A simple design for a four-point probe suitable for precision surface conductivity measurements is described. Our design makes use of small, commercially available spring contact probes which are mounted in a custom built MACOR ceramic probe head. The design is suitable for use in ultrahigh vacuum applications, and the custom-built parts can be fabricated in any machine shop. Very reproducible values were obtained using this probe for surface conductivity measurements on a MoS2(0001) model catalyst, a sputter deposited indium-tin oxide thin film and a doped silicon wafer. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1147968
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