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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 66 (1962), S. 1932-1940 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 34 (1999), S. 1017-1023 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Alumina-silica fibers, produced by air blowing a melt of 47 wt% alumina and 53 wt% silica, are initially amorphous, but may be heat treated to convert them into mullite and increase crystallite size. On heating to near 1000 °C, an exothermic phase transition abruptly produces mullite X-ray peaks. Further 1 hour heat treatments gradually sharpen these peaks until a minimum peak width is reached near 1600 °C. Scherrer calculations of crystallite size show that the mullite crystallites formed near 1000 °C are about 13 nm in diameter; these regions grow to about 100 nm after 1 hour at 1600 °C.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 11 (1982), S. 42-45 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Accurate values for x-ray relative intensity factors, which are the fraction of intensity measured, are important for quantitative calculation procedures used in scanning transmission electron microscope thin film x-ray microanalysis. We have developed equations for calculating these parameters for the K, L and M shells and have applied them to a thin film quantitative analysis procedure. The K shell values were obtained from experimental and theoretical data in the literature and show a constant region between atomic numbers 20 and 30. To obtain L shell values measurements were made with an electron probe and an energy dispersive system on a 200 kV scanning transmission electron microscope. These data were combined with values calculated from Coster-Kronig and fluorescence yield data in the literature. The result was two curves with a step at atom number 51 and a significantly different magnitude than values used in other thin film methods. The following equations for use in a computer program were developed from these curves; aLα1.2(Z=27-50)=1.617-0.0398Z+3.766 × 10-4Z2; aLα1,2(Z=51-92)=0.609-1.619 × 10-3Z-0.03248 sin [0.161(Z-51)].
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
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