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  • 1
    Electronic Resource
    Electronic Resource
    Alloy composition and electronic structure of Cd1−xZnxTe by surface photovoltage spectroscopy (2002)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 703-707 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The alloy composition of a Cd1−xZnxTe(111) sample and its spatial homogeneity have been determined by surface photovoltage spectroscopy (SPS) and compared to conventional energy dispersive x-ray spectroscopy measurements. Experimental improvements of the former technique yield a contactless, surface sensitive, and highly accurate spectral resolution of the band gap (error〈4 meV) and consequently of the Zn concentration (error〈0.6% in comparison with the latter technique). In addition, SPS is capable of determining the face and type of the Cd1−xZnxTe as well as identifying gap states at its surface. The electronic structure has been investigated in comparison with n-CdTe(111), before and after various surface chemical treatments. An acceptor surface state has been observed at 1.21 eV below the conduction band edge and attributed to TeO2. A donor surface state (with a lower concentration relative to the corresponding state in CdTe) associated with Cd atom displacement has been found at 1.42 eV above the valence band maximum. A chemically induced surface state at 0.72 eV below the conduction band edge may be due to Zn vacancies, as supported by x-ray photoelectron spectroscopy measurements. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1425071
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  • 2
    Electronic Resource
    Electronic Resource
    Studies of phase segregation in Cd1−xZnxTe using surface photovoltage spectroscopy (2002)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 81 (2002), S. 436-438 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Cd1−xZnxTe wafers used for x-ray detector arrays have been failure analyzed using x-ray diffraction, x-ray electron spectroscopy (XPS), energy dispersive spectroscopy (EDS), and surface photovoltage spectroscopy (SPS). The last shows ZnTe segregation in failed pixels while the precipitant phase is too small to be observed by the other techniques. The Zn concentration, measured using EDS and XPS, was higher than that deduced from SPS data, confirming the conclusion. The segregation can be revealed only by SPS since it is sensitive to the electronic structure and thus to x in each phase while the other techniques average x over their measurement volume. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1493230
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  • 3
    Electronic Resource
    Electronic Resource
    Influence of Hydrothermal Temperature on Structures and Photovoltaic Properties of SnO2 Nanoparticles (2000)
    Springer
    Journal of nanoparticle research 2 (2000), S. 309-313 
    Details
    ISSN: 1572-896X
    Keywords: hydrothermal synthesis ; nanoparticles ; surface photovoltage ; spectroscopy ; surface state
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics , Technology
    Notes: Abstract Two SnO2 nanoparticles were synthesized by hydrothermal method at 170 °C and 180 °C, respectively. Transmission electron microscope observations reveal that the diameters of both the nanoparticles are around 6 nm. At the same time, surface photovoltage spectroscopy measurements show that the nanoparticle synthesized at 180 °C has more surface electronic states at 0.3 eV below the conduction band than the one synthesized at 170 °C. This means that the temperatures chosen in hydrothermal synthesis have significant influence on the surface electronic characteristics of resultant SnO2 nanoparticles but the effect on their sizes is not obvious. However, after being calcined at 500 °C for 2 h, the diameter of the nanoparticle synthesized at 180 °C increased to 23 nm and that of the nanoparticle synthesized at 170 °C increased to 32 nm as calculated from X-ray diffraction pattern.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1010015111781
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