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  • 1
    Electronic Resource
    Electronic Resource
    Analyzing the Grating Profile Parameters Based on Scanning-Electron Microscope Images (2008)
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 381-382 (June 2008), p. 299-300 
    Details
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Measuring grating profiles is very helpful for the analysis of specifications of gratingsand improvement of grating fabrication techniques. We analyzed grating grooves by digitizing thescanning-electron microscope (SEM) images. Some kinds of filter and arithmetic were developed toextract the contour line of grating profile. In order to analyze the diffraction efficiency affected bythe shape of grating profile, the calculated diffraction efficiency based on the SEM image andmeasured diffraction efficiency based on experiment was compared and analyzed
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/57/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.381-382.299.pdf
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Positional Detection in Grating Mosaic Based on Image Processing of Far-Field Diffraction Intensity Patterns in Two Wavelengths (2008)
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 381-382 (June 2008), p. 291-294 
    Details
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: As an alternative for producing the meter-size diffraction grating demanded in manytechnical field, grating mosaic requires positional detection with accuracy of sub-microns. In thispaper, we propose a positional detection method based on image processing of three far-fielddiffraction intensity patterns in two wavelengths. With a set of detailed adjustment steps deducedfrom theoretical analysis, we successfully detected and separated the two positional errors.Moreover, with the three patterns we enlarged the target range of coarse adjustment required forfurther fine adjustment in longitudinal position. We achieved positional detection sensitivity of lessthan 14 nm, and diagnosed the alignment with the far-field pattern in a third wavelength
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/57/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.381-382.291.pdf
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    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Design of a Two-Degree of Freedom Beating Machine (2005)
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 295-296 (Oct. 2005), p. 607-612 
    Details
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: We propose a new beating machine based on a dual cam and lever mechanism to operate flapping and torsion motions of a dragonfly wing. The beating machine was designed according to the time dependent variation in flapping angle and in torsion angle of a free flight dragonfly. Our experiment results show that the variations in flapping angle and in torsion angle of a wing on beating machine agree well with those of a real free flight dragonfly wing, confirming that our beating machine is available for studying the beating performance. We then use the beating machine to study the aerodynamic force and inertia affecting on the wing by comparing the flapping angle and torsion angle under the normal and vacuum conditions
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/50/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.295-296.607.pdf
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    A Fast Search Coil Sensing Method for Tracking Systems (2005)
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 295-296 (Oct. 2005), p. 601-606 
    Details
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: It is important to track a free flying insect to investigate its flight performance. Conventional video tracking systems are difficult to track a highly maneuverable insect, because the capture frequency of the camera is limited and it can hardly get the position of the insect in real time. We proposed a fast sensing method for insect tracking based on magnetic search coil sensors. It can simultaneously determine the orientation and position of the sensors. We constructed a system, calibrated the magnetic device. We developed a set of calculating methods and measured several positions and angles of coil sensors. The results show that it can rapidly provide the tracking feedback information to meet the requirement for insect tracking
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/50/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.295-296.601.pdf
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    A Two-Color Heterodyne Interferometer Based on Diffraction Grating for Displacement Measurement (2005)
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 295-296 (Oct. 2005), p. 189-194 
    Details
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: A two-color heterodyne interferometer based on the movement of the optical diffraction grating is proposed. The method allows us to measure the phase of synthetic wavelength f s directly and with high accuracy to extend the range of unambiguity for interferometric measurements by using two close wavelengths. Our experiment results show that the uncertainty in displacement measurement caused by the uncertainty in f s is 0.20 µm, smaller than the half of a singlewavelength we used. The fringe order of a single wavelength can be determined without ambiguity. The uncertainty in displacement measurement can be improved further by using a single wavelength
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/50/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.295-296.189.pdf
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    Paper (German National Licenses)
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  • 6
    Electronic Resource
    Electronic Resource
    A Two-Dimensional Surface Profile Imaging Technique Based on Heterodyne Interferometer (2005)
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 295-296 (Oct. 2005), p. 477-482 
    Details
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: A two-dimensional surface profile imaging technique based on heterodyne interferometer is proposed. A piezo translator vibrated grating is used to generate a heterodyne signal. A high speed CCD camera is used to extract the interference signal using a five step method. The uncertainty in the displacement measurement is approximately 0.035 µm within a measurement range of 1.7 µm, confirming the two dimensional heterodyne interferometer is valid for measuring the surface profile. The method is also available for low coherence heterodyne interferometer due to the optical frequency shifts caused by the vibration of grating independent on the wavelength
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/50/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.295-296.477.pdf
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    Paper (German National Licenses)
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