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  • 1
    Electronic Resource
    Electronic Resource
    Erratum: "An ultrahigh vacuum scanning tunneling microscope for use at variable temperature from 10 to 400 K'' [Rev. Sci. Instrum. 65, 3204 (1994)] (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 3717-3717 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146430
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  • 2
    Electronic Resource
    Electronic Resource
    Are the time resolutions for the conventional and the pseudorandom methods for time-of-flight analysis different? (1987)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 58 (1987), S. 2138-2140 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The pseudorandom method for time-of-flight analysis has the advantage over the conventional method of a greatly improved efficiency, but, according to previous theory, the disadvantage that the time resolution is worse. Here we present an improved theory of pseudorandom modulation. We show that the resolution of this method and the conventional method are identical. This conclusion is in agreement with experimental results. The difference between the previously given and present treatment of the pseudorandom method for time-of-flight analysis is discussed. We show that the treatment given previously does not apply to a possible, real experiment, but only to the nonphysical case of an infinitely good time resolution. Second, we show that the additional broadening which was found previously for the pseudorandom method is not inherent to the method, but is due to a nonoptimal choice of the deconvolution function.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1139476
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  • 3
    Electronic Resource
    Electronic Resource
    An ultrahigh vacuum scanning tunneling microscope for use at variable temperature from 10 to 400 K (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 3204-3210 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We report on the construction of an ultrahigh vacuum (UHV) scanning tunneling microscope (STM) specially designed for operation in the entire range of sample temperatures between 10 and 400 K. The sample is cooled by means of a liquid helium continuous-flow cryostat, while the supporting manipulator and the surrounding devices remain at room temperature. This allows rapid variation of the sample temperature. The standard instruments for surface preparation and analysis and the STM are contained in a single UHV chamber. By rotation of the manipulator the sample can be positioned in front of any of these instruments without changing the sample temperature. The performance of the microscope is demonstrated by two examples of images of xenon adsorbed on platinum(111) showing: (a) the evolution of the morphology of a submonolayer of xenon from adsorption at 17K up to desorption at about 90 K and (b) atomically resolved images of the hexagonal incommensurate rotated phase for xenon at monolayer completion.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145219
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  • 4
    Electronic Resource
    Electronic Resource
    On the origin of spurious peaks in pseudorandom time-of-flight analysis (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 1520-1523 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The pseudorandom time-of-flight analysis overcomes the classic trade-off between resolution and transmission and has become a standard tool in inelastic low-energy neutron and atom scattering. However, systematic errors in the machining of the chopper slots as well as the finite thickness of the chopper disk can lead to the appearance of spurious peaks in the time-of-flight spectrum. These spurious peaks are mirror images of the real time-of-flight distribution shifted in the spectrum by a constant number of channels which is uniquely determined by the nature and length of the chopper-slot sequence. These effects can easily be corrected for and will in general not impede the actual time-of-flight analysis. We report a systematic study of the origin of the spurious peaks and show how one can discriminate between the effects stemming from machining errors or from the finite thickness of the chopper disk.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144073
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  • 5
    Electronic Resource
    Electronic Resource
    High-resolution He-scattering apparatus for gas–surface interaction studies (1986)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 2771-2779 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A high-resolution apparatus designed for the study of elastic and inelastic scattering of thermal helium atoms from crystal surfaces is presented. The highly expanded He nozzle beam has an energy spread ΔE/E of about 1.4% and is collimated to 0.2°. The angle subtended by the detector opening as seen from the sample is also 0.2°. Beam intensities as low as 10−6 of the specular beam intensity from a low-temperature clean Pt(111) surface are detectable. Pseudorandom chopping with a resolution of 2.5 μs (flight path 790 mm) is used for time-of-flight (TOF) analysis of the scattered helium. The base pressure in the sample chamber is in the low 10−11 mbar. The capabilities of the apparatus are demonstrated for physisorbed Xe adlayers on Pt(111). The results presented are obtained by using He scattering in various modes: coherent inelastic, coherent elastic, and incoherent (diffuse) elastic. This technique allows for a nondestructive nearly exhaustive characterization of the thermodynamics, structure, and dynamics of physisorbed adlayers on arbitrary substrates.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1139041
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  • 6
    Electronic Resource
    Electronic Resource
    Resonant states of helium atoms scattered from the Pt(110)-(1×2) surface (1995)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 103 (1995), S. 8705-8712 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The specular intensity of helium atoms scattered from the missing-row reconstructed clean Pt(110)-(1×2) surface is measured as a function of the helium beam energy. Sharp resonance features were observed from which four eigenvalues of the He–Pt interaction potential could be determined; ε 0=−6.05±0.05 meV, ε1=−2.93±0.05 meV, ε2=−1.05±0.05 meV, and ε3=−0.32±0.05 meV. Several model potentials were examined and the potential parameters were fitted to these bound states. Excellent agreement with the experimental results is obtained with the shifted-Morse-hybrid (SMH)-potential with a well depth D=−8.17 meV. The shape of the so determined potential is discussed and compared to results from previous studies of the same system. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.470127
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  • 7
    Electronic Resource
    Electronic Resource
    Determination of iodine adlayer structures on Au(111) by scanning tunneling microscopy (1997)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 107 (1997), S. 585-591 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Chemisorbed iodine adlayers on Au(111) films on quartz were studied using scanning tunneling microscopy (STM) at room temperature in air. The iodine was adsorbed by successive deposition of droplets of a dilute solution of iodine in methanol. As a function of coverage, various adlayer structures were obtained. By changing the tunneling parameters, either the iodine adlayer or the Au(111) substrate can be imaged with atomic resolution. In this way, the adlattice properties such as periodicity, orientation and the local absolute coverage have been characterized with high accuracy. In the low coverage range (θ〈0.33), due to the high mobility of iodine atoms, only the unreconstructed Au(111) substrate lattice could be imaged. At θ∼0.33, a (3×3)R30° structure is evident. With increasing coverage, a (p×3) structure of higher iodine packing density is observed, which can be described as a uniaxially compressed (striped) phase. Finally, near monolayer saturation coverage the iodine atoms form a hexagonal moiré-like pattern with long-range height modulation. The results are compared with previous measurements on this system under UHV and electrolyte conditions. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.474419
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