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  • 1
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 10-12 (Jan. 1986), p. 469-474 
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 33 (1998), S. 4267-4285 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract In this paper, we reveal, for the first time, the basic nature of electron–phonon interaction in semiconductor nanocrystals. On the basis of the experimental results on GaAs, GaP, Si nanocrystals, and porous silicon, we further prove that the carrier-induced dynamic strain effect (CIDSE) is a common feature in solids, which plays an extremely important role on the electronic and optical properties of semiconductor nanocrystals. The optical transitions in semiconductor nanocrystals are dominated by multiphonon-assisted electronic transition processes. Nanocrystals with direct-gap and a large pressure coefficient for the band gap (as GaAs) no longer show band-edge emission due to the intrinsic strong electron – long wavelength anharmonic acoustic phonon coupling. Nanocrystals with an indirect-gap show a carrier-induced dynamic Jahn–Teller effect and two fairly strong intrinsic emission bands. Most of the open questions in the semiconductor nanocrystal field, including porous silicon, can be consistently explained by the carrier-induced dynamic strained quantum dot model. © 1998 Kluwer Academic Publishers
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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