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Direct measurement of refractive-index dispersion using a time-delayed technique (1998)

Lin, Shawn-Yu ; Wang, Li ; Zubrzycki, Walt

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 69 (1998), S. 1472-1475

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: We describe a new way to measure the refractive index of dielectric materials using a time-resolved correlation method. By measuring the time delay of femtosecond pulse trains through a dielectric material, we obtain the refractive index of the material. This technique is direct, less surface sensitive, and precise to four digits. Consequently, it gives a true bulk index value. We apply this technique to measure the refractive index of fused silica, InP, and GaAs in the near infrared spectral regime. © 1998 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1148794

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