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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 7173-7180 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The use of the transmission-line-matrix (TLM) method for analyzing the grain boundary and interfacial diffusion problems in thin films is demonstrated. The method employed has a variable mesh and automatic time-stepping capability, and is highly versatile in treating complex structures and incorporating various boundary conditions. The present model takes account of separate diffusion coefficients in grain boundaries, grains, interfaces, and the substrate. The combined diffusion problems are solved as a function of position and time, and the concentration distributions are presented as clearly visible isometric projections and contour plots. The results are compared with those of semi-infinite samples (Whipple's analysis [Philos. Mag. 45, 1225 (1954)]) and idealized thin-film systems (Gilmer and Farrell's analysis [J. Appl. Phys. 47, 3792 (1976)]), with the emphasis being placed on the differences due to the treatment of concentration flux along the interface between the film and the substrate and into the substrate. The TLM method is shown to have considerable potential in practical applications for diffusion processes in thin films.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 7 (1994), S. i 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 6 (1993), S. 109-126 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The difference equations of the scalar linear transmission-line matrix (TLM) routine as introduced by Johns for numerically solving the diffusion equation are shown to be isomorphic to Goldstein's correlated random walk model of diffusion. For the infinite homogeneous bar their exact solution is derived algebraically and given in the form of Jacobi polynomials. This puts the TLM algorithm on a sounder mathematical and physical basis. The accuracy in solving the diffusion equation is investigated in general form and thus its astonishing efficiency explained. Several other basic questions of this numerical technique are also discussed.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 5 (1992), S. 129-137 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: This paper reports the results of a study of an error parameter, m, which has been proposed as a measure for determining the effects on accuracy of the basic assumptions upon which TLM modelling of diffusion and heat flow has been founded. The nature of the m parameter is studied in detail by using a two-dimensional thermal diffusion problem. The use of m in the implementation of automatic timestepping is discussed in a practical three-dimensional engineering problem.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 8 (1995), S. 313-313 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 6 (1993), S. 165-166 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 5 (1992), S. 121-127 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A random flight model of linear transport processes in two spatial dimensions is considered and solved exactly in closed algebraic form. Its one-dimensional version had been proposed by Taitel as a means to overcome the paradox of infinite speed of propagation within classical heat diffusion theory. The connection with hyperbolic diffusion theory is complemented here by deriving the discrete fluxes and their relaxation term. Moreover, such an approach circumvents the discretization of a continuum model for an intrinsically discrete process, when diffusion processes are to be solved numerically. Finite samples are treated by means of the reflection method. Some applications of these general results are mentioned.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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