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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 2090-2092 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this work, we report on the observation of two coexisting patterns in magnetic force microscopy (MFM) images of shape memory alloys. The MFM signal of both patterns presents similar behavior with tip–surface separation. An investigation on the origin of these patterns presents strong evidence that both are of magnetic nature only and, furthermore, can be assigned as bulk and surface-related, respectively. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 1712-1714 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this letter, we present an atomic force microscopy study of a series of Te-mediated InAs/GaAs samples with InAs coverage ranging from 1.5 to 3 monolayers. We were able to directly identify the growth mode transition and the mechanism of relaxed island formation. At the limit of coherent growth mode, strained quantum dots aggregate, forming twin quantum dots (TQDs), which are structures of two, or more, dots virtually bonded together, separated by less than 3 nm. The onset of the incoherent mode is then unambiguously characterized by the coalescence of individual TQDs forming initially small, and then larger, relaxed islands. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Atomic force microscopy (AFM) was employed to analyse ultrafine MnZn ferrite powders, obtained by precipitation from metal sulphates and sodium hydroxide at 110 and 190°C, under hydrothermal conditions. Particle sizes measured on AFM images taken at the surfaces of pressed samples ranged from 10 to 40 nm, as a function of synthesis temperature, and were in good agreement with measurements made using X-ray diffraction and the Brunnauer–Emmett–Teller (BET) technique. Direct observation also showed that the particles were monodispersed and approximately spherical in shape, meeting the requirements for the production of high density sintered components. Using a straightforward sample-preparation technique, AFM proved to be a powerful tool for direct analysis of ceramic powder particles on the nanometre scale.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 32 (1997), S. 1005-1008 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Pearlite interlamellar spacing is an important parameter controlling ductility and strain hardening of carbon steels. Fine pearlite is the appropriate initial microstructure for drawing high carbon steel with exponential strain hardening rate, leading to high final tensile strengths. The majority of optical and electron microscopy methods for measuring interlamellar spacing present difficulties when applied to fine microstructures. Atomic force microscopy (AFM) was employed to investigate pearlitic steels lead patented at 510 °C and then cold drawn to 86% reduction in area. Conventional specimen preparation techniques for optical metallography were appropriated to produce high resolution AFM images, on which measurements of minimum interlamellar spacing, in good agreement with spacings estimated using the Embury–Fisher model, were easily performed.
    Type of Medium: Electronic Resource
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