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  • 1
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 113 (2000), S. 3874-3881 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: We have measured the electron-stimulated desorption of metastable molecular nitrogen (N2*) from N2 condensed onto solid thin films of water of varying preparation. Structures seen in the N2* yield function permit the quantity of N2 at the film–vacuum interface to be monitored and hence allow one to study changes in the effective surface area of the water film. This latter quantity is itself related to the porosity of the film. When deposited onto porous water, N2 molecules penetrate into the film and throughout its pores covering their large surface area. Under these conditions, the signal of desorbing N2* particles is inversely proportional to the surface area of the pores. We present a simple model for N2 film growth on a porous film. Its mathematical formulation allows the pore area and pore volume of amorphous water films to be measured. The surface region of crystalline water films is also found to be rough. Moreover, the porosity of solid water films is found to be dependent on the substrate on which the film is grown. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 115 (2001), S. 4811-4818 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: We investigate the effects of the geometrical structure (phase and porosity) of multilayer benzene films on the desorption of O− induced by 2–20 eV electron impact on varying quantities of absorbed O2. Differences in the yield of O− from O2 doped amorphous and crystalline benzene films are attributed to the ability of O2 to diffuse into the amorphous solid via pores and defects formed during its deposition at 20 K. In contrast, diffusion into crystalline benzene is limited and deposited O2 molecules remain at the surface of the film. Thermal desorption measurements support this analysis. The data are also compared with results of similar experiments for O2 on water. While it is apparent that some of the variation in O− yield observed from ice films is similarly related to morphology, a substantial suppression of the O− yield is likely to result from energy loss by electrons prior to dissociation. Quenching of intermediate O2− states by water ice may also contribute to this suppression in the range 5–12 eV. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 113 (2000), S. 8746-8752 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: We have measured for the 0–20 eV incident energy range, the low-energy electron transmission (LEET) spectra and electron stimulated desorption (ESD) yields of H− from pure films of n-hexane and ethyl-benzene from 20 K to sublimation. The ESD yields from both dissociative electron attachment and dipolar dissociation initially increase as the films are heated. This effect is attributed to the collapse of pores within the films. For n-hexane, a marked decrease in ESD yields is observed at film temperatures ≥80 K, which correlates to the onset of crystallization as evidenced in LEET spectra. This decrease in anion yield is associated with the formation of a well-defined band structure that reduces the time period an excitation and/or electron resides on a particular molecule. This behavior in the ESD yields from ethyl-benzene films is not observed prior to sublimation in agreement with LEET spectra which show negligible change with film temperature indicating that there is no change of phase prior to sublimation (i.e., the film remains amorphous at all temperatures). © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 95 (1991), S. 2910-2918 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The energy dependence for electron trapping by H2O molecules condensed onto thin films of Kr and Xe has been measured between 0.4 and 11.0 eV. From these measurements, absolute cross sections for electron trapping were deduced and found to reach magnitudes in excess of 10−16 cm2 for incident kinetic energies smaller than 1.0 eV. This trapping is associated with electron capture by clusters of water molecules, a process related possibly to the solvation of the electron following the radiolysis of water. Near 0 eV, the cross section is so large that appreciable charging occurs when electrons of low residual energy are created at the onset of exciton formation in the Kr and Xe substrates. From 6.0 to 9.0 eV, further charge trapping proceeds via dissociative attachment, but a contribution from electrons scattered from electronic states of H2O cannot be excluded.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 109 (1998), S. 8635-8640 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Anion desorption stimulated by the impact of 0–20 eV electrons on O2/hydrocarbon mixed films is reported. It is shown that part of the H−, OH−, CH−, and CH2〈sup ARRANGE="STAGGER"〉− desorption yields from O2/hydrocarbon films is the result of reactive scattering of O− fragments produced via dissociative electron attachment (DEA) in the alkane and alkene thin films. These results support the interpretation that the DEA O− react with the hydrocarbon molecules to form a transient molecular anion complex which, in addition to autodetachment, may decay by dissociation into various anion and neutral fragments, and thus cause chemical modification of the solid. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 106 (1997), S. 749-760 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: We report cross sections for the trapping of 0–10 eV electrons by CH3Cl and CH3Br physisorbed onto a Kr covered Pt substrate, measured as a function of Kr film thickness and methyl halide concentration. The molecules stabilize electrons incident at the surface by the dissociation of transient CH3Cl− and CH3Br− ions into an atomic anion and a neutral fragment [dissociative electron attachment DEA]. For CH3Cl, the condensed phase absolute DEA cross section at (approximate)0.5 eV, reaches 13×10−18 cm2±50%, which is 104–106 times larger than the gas phase cross section. At higher energies (5–10 eV) for CH3Cl, our measurements provide a lower limit for the DEA cross section. For CH3Br, the maximum DEA cross section occurs below the vacuum level; we measure an absolute magnitude of 3.0×10−16 cm2±50% near 0 eV, which is 100 times larger than the corresponding gas phase value. These enhancements in cross section arise from the lowering of the potential energy surfaces of intermediate anions due to polarization induced in the Kr layer and metal substrate. An increase in DEA cross section with a reduction in the distance of transient anions from the metal surface, is explained by the effect of image charges on the energy at which anion and neutral ground state potential energy curves cross. Below thicknesses of 5 ML of Kr, a decrease in DEA cross section is observed and attributed to a reduction in the electron capture probability of the halide due to competition with transfer to the metal substrate. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 104 (1996), S. 4258-4266 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: We have measured the charge trapping cross section for the chloromethane molecules CCl4, CHCl3, and CH2Cl2 physisorbed onto Kr films. Within the 0–10 eV range investigated, charge is stabilized at the surface as atomic anions which are formed by dissociative electron attachment (DEA) to the molecules. Intermediate anion states previously observed in gas phase experiments are apparent. Below ≈4 eV electron impact energy, the charge trapping cross section becomes an absolute cross section for DEA because of the absence of a desorbed ion signal. At higher energies, our results provide a lower limit for this same quantity. Comparisons with gas phase cross sections, show substantial and systematic differences that can be understood in terms of the interaction between the intermediate anion states and electronic polarization field they induce on the Kr surface. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 3883-3889 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We investigate several problems inherent in the low energy electron transmission (LEET) technique for measuring cross sections σCT for charge trapping, by submonolayer (ML) quantities of a target molecule deposited onto the surface of a dielectric film. In particular we see that the energy of the incident electron beam while charging the film was poorly defined in the original method. Furthermore, we demonstrate that interactions between trapped charges and the metallic substrate set a limit of about 100 mV for the maximum surface potential that should be allowed in absolute measurements of CT cross sections. To surmount these problems, we show how the surface potential ΔV generated by electrons of specific incident energy can be obtained rapidly, by monitoring the relative transmitted current Ir at a single reference energy EREF, rather than by recording multiple LEET spectra (or injection curves). The approach allows several measurements at different incident electron energies to be made on a single film and increases markedly the rate of data acquisition. The overall uncertainty in these measurements has an upper limit of ∼50%. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 2740-2748 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We investigate charging of insulators with an apparatus that allows measurements of trapped charges resulting from the impact of monoenergetic electrons of 0.1–28 eV. Details are given on the construction and operation of this instrument. A high-resolution electron monochromator provides a pulsed electron beam of variable energy and current. Accumulated surface charge is monitored using a Kelvin probe and a high-sensitivity electrometer. An ultraviolet source of adjustable maximum frequency allows the sample to be discharged for multiple measurements on the same sample. We illustrate the use of the instrument with preliminary measurements for ∼100 μm thick samples cut from an industrial polyethylene cable. The incident electron-energy dependence of the trapping probability exhibits large variation and indicates that electrons with energies 〈5 eV are the most efficiently trapped; charging near 10 eV is attributed to dissociative electron attachment to polyethylene molecules. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Palo Alto, Calif. : Annual Reviews
    Annual Review of Physiology 21 (1959), S. 49-68 
    ISSN: 0066-4278
    Source: Annual Reviews Electronic Back Volume Collection 1932-2001ff
    Topics: Medicine , Biology
    Type of Medium: Electronic Resource
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