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  • 1
    Electronic Resource
    Electronic Resource
    Short- and long-range ion-beam mixing in Cu:Al (1982)
    Springer
    Applied physics 29 (1982), S. 141-145 
    Details
    ISSN: 1432-0630
    Keywords: 61.80Jh ; 61.70Tm ; 64.75+g
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Ion-beam mixing by 500-keV xenon ions has been studied in targets consisting of 2000-Å films of aluminium on a polycrystalline aluminium substrate, onto which has been evaporated a 500-Å overlayer of copper. Both long- and short-range-mixing processes have been identified, by RBS analysis of the irradiated targets, as a deep copper tail in the aluminium and interfacial broadening, respectively. The long-range component varies linearly with xenon fluence, is temperature-independent in the interval 40–500 K, and is not influenced by the presence of an interfacial oxide layer between the copper and aluminium layers. The number of long-range-mixed atoms is in agreement with theoretical estimates of the recoil mixing. The short-range mixing, which is the dominating process, has a squareroot dependence on xenon fluence and is independent of temperature between 40 and 300 K, increasing rapidly at higher temperatures. The broadening attributed to the short-range mixing is explained by interstitial diffusion within the cascade. For small xenon fluences, interfacial oxide layers inhibited both short-range mixing and thermal diffusion. Higher xenon fiuences subdued the inhibition.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00617770
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  • 2
    Electronic Resource
    Electronic Resource
    Energy-loss straggling for protons and helium ions
    Amsterdam : Elsevier
    Physics Letters A 61 (1977), S. 75-77 
    Details
    ISSN: 0375-9601
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0375-9601(77)90270-5
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  • 3
    Electronic Resource
    Electronic Resource
    Oxygen chemisorption on metal surfaces: General trends for Cu, Ni and Ag
    Amsterdam : Elsevier
    Progress in Surface Science 44 (1993), S. 5-66 
    Details
    ISSN: 0079-6816
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0079-6816(93)90006-H
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  • 4
    Electronic Resource
    Electronic Resource
    Deuterium-induced restructuring of Cu(100)
    Amsterdam : Elsevier
    Chemical Physics Letters 215 (1993), S. 535-540 
    Details
    ISSN: 0009-2614
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0009-2614(93)89351-H
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  • 5
    Electronic Resource
    Electronic Resource
    Compact, high-stability, "thimble-size'' scanning tunneling microscope (1988)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 1035-1038 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new high-stability scanning tunneling microscope (STM) has been developed. Its key design feature is the application of two, concentrically aligned, piezoelectric ceramic tubes, allowing x–y–z motion of the tungsten tip as well as sample mounting to be cast into a single compact unit. The construction is small, very rigid, and temperature compensated, yielding reduced sensitivity to mechanical and acoustic vibrations and temperature variations. Other advantages of this "thimble-size'' STM include easy sample mounting and, at a later stage, operation under UHV conditions with access to other surface-analysis (UHV) tools. At present, the microscope is operated in air, and its performance is tested by imaging a highly oriented pyrolytic graphite surface and a Si(111) surface on which a 100-A(ring)-thick Au layer has been deposited.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1139775
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  • 6
    Electronic Resource
    Electronic Resource
    Calibration of the electrical response of piezoelectric elements at low voltage using laser interferometry (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 2530-2531 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A laser interferometric method is described by which the length-to-voltage sensitivity of piezoelectric elements, as used e.g., in scanning tunneling microscopes, can be calibrated. The method is based on measuring the optical frequency of a laser locked to a piezoelectrically tuned interferometer, relative to a stable reference. The high sensitivity of this technique allows the calibration to be carried out in the low-voltage regime.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.101064
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  • 7
    Electronic Resource
    Electronic Resource
    The reaction of carbon dioxide with an oxygen precovered Ag(110) surface (1995)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 103 (1995), S. 9825-9831 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The reaction of CO2 with an oxygen precovered Ag(110) surface leading to the formation of carbonate has been studied by scanning tunneling microscopy (STM) for different oxygen precoverages. For coverages below 0.5 monolayers (ML), the reaction is initiated preferentially at steps and defects and spreads uniaxially along the [001] directed, added -Ag–O- rows. For initial oxygen coverages below 0.25 ML, complete transformation to the carbonate structure is observed. For higher initial oxygen coverage, the unreacted rows are compressed to a (2×1) structure. In all cases, the ratio of carbonate ions formed to oxygen atoms consumed from added rows is close to 1:2. The reaction leads to a new reconstruction of the surface in which the carbonate ions are seen to reside preferentially on top of [11¯0] directed triplet structures. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.469949
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  • 8
    Electronic Resource
    Electronic Resource
    A high-pressure scanning tunneling microscope (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 3537-3542 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We present the design and performance of a high-pressure scanning tunneling microscope (HP–STM), which allows atom-resolved imaging of metal surfaces at pressures ranging from ultrahigh vacuum (UHV) to atmospheric pressures (1×10−10–1000 mbar) on a routine basis. The HP–STM is integrated in a gold-plated high-pressure cell with a volume of only ∼0.5 l, which is attached directly to an UHV preparation/analysis chamber. The latter facilitates quick sample transfer between the UHV chamber and the high-pressure cell, and allows for in situ chemical and structural analysis by a number of analytical UHV techniques incorporated in the UHV chamber. Reactant gases are admitted to the high-pressure cell via a dedicated gas handling system, which includes several stages of gas purification. The use of ultrapure gasses is essential when working at high pressures in order to achieve well-defined experimental conditions. The latter is demonstrated in the case of H/Cu(110) at atmospheric H2 pressures where impurity-related structures were observed. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1389497
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  • 9
    Electronic Resource
    Electronic Resource
    A fast-scanning, low- and variable-temperature scanning tunneling microscope (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 1438-1444 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design and performance of a fast-scanning, low- and variable-temperature, scanning tunneling microscope (STM) incorporated in an ultrahigh vacuum system is described. The sample temperature can be varied from 25 to 350 K by cooling the sample using a continuous flow He cryostat and counter heating by a W filament. The sample temperature can be changed tens of degrees on a time scale of minutes, and scanning is possible within minutes after a temperature change. By means of a software implemented active drift compensation the drift rate can be as low as 1 nm/day. The STM is rigid, very compact, and of low weight, and is attached firmly to the sample holder using a bayonet-type socket. Atomic resolution on clean metal surfaces can be achieved in the entire temperature range. The performance of the instrument is further demonstrated by images of adsorbed hexa-tert-butyl-decacyclene molecules on Cu(110), by STM movies, i.e., sequential STM images with a time resolution down to 1 s/image (100×100 Å2 with 256×256 pixels), of the mobility of these molecules, and finally by constant current images of standing waves in the electronic local density of states on Cu(110). © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1337068
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  • 10
    Electronic Resource
    Electronic Resource
    Fast and accurate current-voltage curves of metallic quantum point contacts (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 1793-1803 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We present an experimental setup for measuring the electrical conductance through metallic quantum point contacts (QPCs) under constant or time-dependent bias voltage conditions. The response time of the setup is as short as 25 ns and typical bias voltages range from 10 mV to 2 V. A function generator is used as bias voltage supply. With this, voltage bursts with a frequency of up to 100 kHz can be applied to the QPCs, whereby current-to-voltage (I–V) curves can be acquired using a homebuilt, 30 MHz bandwidth I–V converter, and a 100 Msamples/s digital storage oscilloscope. Test experiments on resistors show that nonlinear contributions to the I–V curves are always less than 1% of the current for all applied voltages. From the slope of the I–V curves, the conductance can be determined with an accuracy better than 1%. The QPCs are formed between a single-crystal metal sample and the tip of a scanning tunneling microscope under clean ultrahigh vacuum conditions. We demonstrate how the setup can be used to capture the I–V curves of several metastable states in a Au QPC, as it breaks during a period of 200 μs at room temperature. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150539
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