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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 66 (1995), S. 142-144 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Soda lime glass was implanted sequentially with Ti+ and N+ to doses ranging from 2 to 30×1016 cm−2 in order to study the resulting optical properties. Analysis of the implant distributions was made by using Rutherford backscattering and x-ray photoelectron spectroscopy and revealed profiles which closely followed each other as designed by the selection of implant energies. Analysis of optical properties showed that the highest dose resulted in an increase in the fraction of infrared reflected by more than a factor of 4 versus 1.7 for the visible regime. The percentage of the total solar radiation rejected exceeded 60% at the highest dose, indicating that the buried layer is highly effective in reducing solar load. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 4 (1971), S. 356-370 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Complete stereographic Kikuchi maps have been generated by computer plotting for b.c.c. (α-Fe), f.c.c. (Cu), h.c.p. (Mg), and diamond cubic (Si) lattices at 500 kV as well as for Si at 20 kV. The method offers considerable advantage over the usual laborious pasting together of individual diffraction patterns in order to map Kikuchi space. To facilitate the use of these maps in 100–1000 kV electron microscopy, indexed standard (001) stereographic triangles are presented for b.c.c. and f.c.c. along with the complete maps described above. The 20 kV silicon map is intended for use in scanning electron microscopy, where Kikuchi-like patterns called Coates patterns arise. Applications of the maps in transmission and scanning electron microscopy are described briefly.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 11 (1982), S. 51-54 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An x-ray fluorescence technique was developed to analyze the thickness of Ag and Pd metallization layers on the back side contacts of Si solar cells. The technique employed a Sn secondary target x-ray source excited by a Cr target x-ray tube. Sn Kβ excited Ag Kα in the overlying Ag contact while Sn Kα and Kβ excited Pd Kα in the underlying Pd film. The emitted Ag and Pd Kα intensities were compared with corresponding intensities emitted from pure bulk Ag and Pd standards. Attenuation of Sn Kβ and Sn, Ag and Pd Kα in the Ag contact and in the standards was accounted for in the calculations. The results on 17 cells compared favorably with neutron activation analyses. An accuracy of ±10% was estimated for a 40 nm Pd film beneath a 7 μm Ag contact. Palladium films as thin as 1.5 nm were analyzed. The technique is nondestructive and can be applied to process control in a production environment as well as to laboratory testing of experimental cells.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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