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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 3045-3048 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The ablation of free-standing metal films by picosecond laser pulses (50 ps, 0.6–8 J/cm2, 532 nm) was visualized by electron microscopy. Triple-frame high-speed transmission electron microscopy was applied, with exposure times below 5 ns and frame repetition times (approximately-greater-than)20 ns. Ablation was observed to proceed by hole opening within 5–30 ns, speeding up with increasing laser fluence, and punching out of most of the melt. Once opened, the holes expanded by capillary forces with a velocity of ≈100 m/s for some 10 ns. At large pulse fluences the evaporation was collimated along the film axis. This and the absence of patterned flow of the melt are conspicuous differences to the ablation of films by nanosecond laser pulses. The effects typical for picosecond pulses are attributed to an evaporation that is one-sided because of a thermal gradient along the film axis, and that exerts a large recoil.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 6355-6358 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new mechanism is described which produces short-wave patterns in a freezing metal melt that contains surface active impurities. The main feature of the process is a periodic accumulation of the impurity atoms in sharp crests of a rake wave, which forms due to segregation of the impurity atoms ahead of the crystallization front, and which moves with the same velocity. The local rise of the concentration of the impurity increases the chemocapillary surface forces, whereby "excitations" are emitted in opposite directions into the melt. These excitations interact with the crystallization front and produce ripples on a solidifying surface. The model was used to explain ripples in solidified melts produced by short laser pulses in Au and Al films. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 480-485 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Evaporation triggered with nanosecond laser pulses in self-supporting aluminum films was imaged by high-speed transmission electron microscopy. This unconventional method provides up to three images from a single transient process with exposure times ≥5 ns and at intervals ≥25 ns with a spatial resolution of 100 nm. The chronological order of ablation was observed on the nanosecond time scale by successive shifting of the moment of exposure. Information was obtained about the mode and duration of evaporation. The ablation reveals a threshold behavior. Above a laser energy density of 5–6 J/cm2 the irradiated film region is completely evaporated during the laser pulse. Below this threshold evaporation is marginal and the film disintegrates mainly by liquid flow. The experimental results are compared with a new model comprising two different evaporation mechanisms, surface and volume evaporation. The ablation as observed cannot be explained by surface evaporation only. The strong rise of the evaporation rates above the threshold is associated with the onset of volume evaporation. It is also shown that the vaporization enthalpy must be considered as a function of temperature for a correct modeling of evaporation by short laser pulses. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 8027-8031 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A time-resolving thermal-emission electron microscope was developed for tracking transient phenomena on pulse-laser-heated metal surfaces. Short-time exposures with a temporal/spatial resolution of 3 ns/1 μm were achieved by adding a high-gain image intensifier and a fast beam blanking unit to a conventional emission microscope. Fast surface heating was realized using a frequency-doubled neodymium yttrium aluminum garnet pulse laser (12 ns full width at half-maximum). Experiments with tungsten and tantalum are presented, showing the potential of this method for imaging fast changes of local surface parameters, e.g., temperature. The emission microscope is found to be a sensitive probe for incipient laser-induced modifications of the surface, even in the conventional mode. Apart from this some technical problems as well as the physical limitations of time-resolved thermal-emission microscopy are discussed.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 8201-8205 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Time-resolved transmission electron microscopy (TEM) was applied to study phase transitions in free-standing Ni0.75Al0.25 films, induced by pulses from an Nd:YAG laser (20 ns, 532 nm). At fluences above 0.23 J/cm2 melting occurred within the laser pulse, the liquid was set into violent motion during 300 ns after melting, and the film solidified 1–2 μs later. The liquid motion was triggered by expansion of the melting film. Solidification proceeded by heterogeneous nucleation of crystals at the periphery of the laser molten spot and by centripetal growth of large plates with velocities 0.9–2.4 m/s, from which a supercooling of 2–20 K at the liquid/crystal interface is inferred. The final texture consisted of large γ and γ' crystals plus fine-grained Al precipitates. The dynamics were either continuously traced or intermediate stages were visualized by double-frame TEM with exposure times of some 10 ns.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 8725-8729 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The dynamics of melts, as induced by 7 ns laser pulses in Al and Au films, were investigated by in situ time-resolved transmission electron microscopy. Melting, motion of the liquid, and crystallization were observed by tracing the image intensity with a photomultiplier (space/time resolution 100 nm/3 ns) and by streak imaging (streak times 15 ns–4 μs). Films with native oxides/adsorbed atmospheric contaminations and films purified by pulse melting were found to show a completely different behavior of their melts. The melts of purified films either remained almost flat (Al) or revealed a gradual pileup of liquid in cold regions within 500 ns (Au), caused by thermocapillarity with the negative thermal coefficient of the surface tension of pure metals. In contrast, contaminated films showed three distinctly different types of perturbations: (1) a fast expulsion of the melt from the center of the laser spot within 20 ns after the laser pulse; (2) a gradual contraction of liquid at the center within 0.5–1 μs; (3) thickness oscillations with frequencies of 5–10 MHz and time constants of 500 ns. These effects are explained by recoil from evaporating contaminations, by thermocapillary flow with a positive thermal coefficient of the surface tension, caused by surface active impurity atoms, and by thermocapillary waves. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 3020-3025 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A study of the temporal response of a biased planar nematic liquid crystal to short (∼10 μs) voltage pulses is presented. The resulting optical phase shift varies quadratically with time during the first 2 μs after switching the voltage on and then linearly. A theoretical model is developped starting from the Leslie-Ericksen theory which describes the investigated phase modulation in the microsecond time scale. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 2037-2044 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new method is established to determine surface tension and mechanisms of evaporation of liquid metals in a wide range of high temperatures. It is based on a combination of high-speed transmission electron microscopy imaging of flow in nanosecond laser pulse molten films and computer simulation. The technique was applied to iron films with native oxides to investigate the effects of surface active impurities in a melt with transient temperatures and gradients up to 4000 K and 5×108 K/m, respectively. Such melts show a shear flow with direction changing once or twice during 1–2 μs after a 20 ns laser pulse, which cannot be simulated using table values for the temperature coefficient of the surface tension and the vapor pressure. Instead, evaporation is negligible, and the flow of the liquid is mainly driven by a fast changing gradient of the surface tension caused by a time-varying distribution of temperature and dissolved surface active oxygen atoms. Current site coverage models, giving the surface tension as function of temperature and impurity content for static liquids, successfully can be applied to liquids moving on the nanosecond/micrometer scale, too. However, the number of active surface sites can be vastly reduced by short-lived oxide covers, e.g., in iron with native oxides down to 3.5% of the total number of surface sites. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 7427-7427 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 135-142 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The ablation of free-standing thin aluminum films by a nanosecond laser pulse was investigated by time-resolved transmission electron microscopy and numerical simulation. It was established that thin film geometry is particularly suited to furnish information on the mechanism of evaporation and the surface tension of the melt. In the case of aluminum the surface tension σ as function of temperature can be approximated by two linear sections with a coefficient −0.3×10−3 N/K m from the melting point 933 K up to 3000 K and −0.02×10−3 N/K m above 3000 K, respectively, with σ(933 K)=0.9 N/m and σ(8500 K)=0. At lower pulse energies the films disintegrated predominantly by thermocapillary flow. Higher pulse energies produced volume evaporation, and a nonmonotonous flow, explained by recoil from evaporating atoms and thermocapillarity. The familiar equations of energy and motion, which presuppose separate and coherent vapor and liquid phases, were not adequate to describe the ablation of the hottest zone. Surface evaporation seemed to be marginal at all laser pulse energies used. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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