Electronic Resource
[S.l.]
:
International Union of Crystallography (IUCr)
Acta crystallographica
50 (1994), S. 9-17
ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
Two methods for evaluating the probability distribution of X-ray intensities are presented. The first is an exact series representation in powers of the atomic form factors. Overall thermal-displacement and scale parameters are shown to be dependent only on the ratio of intensity to σ2. The second method is a maximum-entropy distribution based on the first two moments of the intensity distribution. It is shown to be a robust and accurate method of incorporating heavy-atom effects and results in a simple generalization of the Wilson distribution.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0108767393002880
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