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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 5865-5868 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Two charge states are observed for Ru in doped PbTiO3 crystals using electron paramagnetic resonance (EPR). The two paramagnetic charge states are +3 and +5. The g tensors for the Ru3+ and Ru5+ defects were found to be near axial: g(parallel)(approximately-equal-to)1.155 and g⊥(approximately-equal-to)2.188 for the Ru3+ center and ge(parallel)(approximately-equal-to)2.0045 and ge⊥(approximately-equal-to)3.959 for the Ru5+ center. Analysis of the EPR spectra by crystal field theory indicates that the Ru3+ ions are in tetragonally distorted (elongated) octahedral sites, strongly suggesting that they substitute for the central Ti4+ ions in the perovskite lattice. Analysis of the Ru5+ EPR spectra indicate that this defect is also in an octahedral site with a very large zero field splitting parameter. The results suggest that both Ru3+ and Ru5+ can substitute for Ti4+ in the perovskite lattice with self-compensation. Last, it is found that optical illumination of the crystals with band-gap light at low temperatures decreases the density of both Ru centers. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Westerville, Ohio : American Ceramics Society
    Journal of the American Ceramic Society 87 (2004), S. 0 
    ISSN: 1551-2916
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Thin films of Pb(Zr0.4TiO.6)O3 produced by chemical solution deposition were used to study the effects of stress from different platinized single-crystal substrates on film orientation and resulting electrical properties. Films deposited on MgO preferred a (001) orientation due to compressive stress on the film during cooling through the Curie temperature (TC). Films on Al2O3 were under minimal stress at TC, resulting in a mixture of orientations. Those on Si preferred a (111) orientation due to templating from the bottom electrode. Films oriented in the 〈001〉 direction demonstrated lower dielectric constants and higher Pr and −d31 values than (111) films.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Westerville, Ohio : American Ceramics Society
    Journal of the American Ceramic Society 84 (2001), S. 0 
    ISSN: 1551-2916
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Lead niobium zirconate titanate (PNZT) pastes with tailored rheological properties have been developed for direct-write fabrication of thick-film capacitor elements in highly integrated, multifunctional electroceramic devices. Such pastes exhibited pseudoplastic behavior with a low shear apparent viscosity of roughly 1 × 106 cP. On aging, the degree of shear thinning and the low shear apparent viscosity decreased. Pastes prepared from as-received powders attained printable, steady-state viscosities of ∼2 × 105 cP after 50 days of aging. In contrast, pastes prepared from dispersant-coated powders showed no measurable rheological changes after 1 day of aging. Square elements were patterned on dense alumina substrates or Teflon sheets. Leveling behavior as a function of time for single line prints, and the resulting surface topographies of dried PNZT films were measured by laser profilometry. PNZT layers sintered at varying temperatures between 950° and 1050°C for 5 h in either air or a lead-rich atmosphere yielded porous microstructures as revealed by scanning electron microscopy (SEM). Such layers exhibited dielectric constants (K) of 1400–1570 at 1 kHz with dissipation factors (D) of less than 4.1%.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Westerville, Ohio : American Ceramics Society
    Journal of the American Ceramic Society 82 (1999), S. 0 
    ISSN: 1551-2916
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Columnar and highly oriented (100) BaTiO3 and SrTiO3 thin films were prepared by a chelate-type chemical solution deposition (CSD) process by manipulation of film deposition conditions and seeded growth techniques. Randomly oriented columnar films were prepared on platinum-coated Si substrates by a multilayering process in which nucleation of the perovskite phase was restricted to the substrate or underlying layers by control of layer thickness. The columnar films displayed improvements in dielectric constant and dielectric loss compared to the fine-grain equiaxed films that typically result from CSD methods. Highly oriented BaTiO3 and SrTiO3 thin films were fabricated on LaAlO3 by a seeded growth process that appeared to follow a standard “two-step” growth mechanism that has been previously reported. The film transformation process involved the bulk nucleation of BaTiO3 throughout the film, followed by the consumption of this matrix by an epitaxial overgrowth process originating at the seed layer. Both BaTiO3 and PbTiO3 seed layers were effective in promoting the growth of highly oriented (100) BaTiO3 films. Based on the various processing factors that can influence thin film microstructure, the decomposition pathway involving the formation of BaCO3 and TiO2 appeared to dictate thin film microstructural evolution.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Westerville, Ohio : American Ceramics Society
    Journal of the American Ceramic Society 80 (1997), S. 0 
    ISSN: 1551-2916
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Integration of oxide thin films with semiconductor substrates is a critical technology for a variety of microelectronic memory and circuit applications. Patterned oxide thin film devices are typically formed by uniform deposition followed by postdeposition ion-beam or chemical etching in a controlled environment. This paper reports details of an ambient atmosphere technique which allows selective deposition of dielectric oxide thin layers without postdeposition etching. In this method, substrate surfaces are selectively functionalized with hydrophobic self-assembled monolayers of octadecyltrichlorosilane by microcontact printing (μ-CP). Sol-gel deposition of ceramic oxides on these functionalized substrates, followed by mild, nonabrasive polishing, yields high-quality, patterned oxide thin layers only on the unfunctionalized regions. A variety of micrometer-scale dielectric oxide devices have been fabricated by this process, with lateral resolutions as fine as 4 μm. In this paper, we describe the solution chemistry, evolution of microstructure, and electrical properties of Ta2O5 thin films, as well as the stress-related mechanism which enables selective de-adhesion and resultant patterning. Selectively deposited, 80-120 nm thick Ta2O5 thin film capacitors were crystallized on platinized silicon at 700-800°C, and had dielectric constants of 18-25 depending upon the processing conditions, with 1 V leakage current densities as low as 2 × 10−8 A/cm2. The ability to selectively deposit Ta2O5 and other electrical ceramics (such as LiNbO3 and PbTiO3) on a variety of technologically important substrate materials suggests broad potential for integrated circuit and hybrid microelectronics applications.
    Type of Medium: Electronic Resource
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  • 6
    ISSN: 1573-4846
    Keywords: BST ; sol-gel ; thin films ; tunable dielectric
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract We have recently isolated the neo-pentoxide (HOCH2CMe3, ONp) derivatives of Ba, Sr, and Ti as Ba4(ONp)8(HONp)6(py)2, Sr5(O)(ONp)8(Solv)5 (Solv = solvent), and Ti2(ONp)8, respectively. The combination of these precursors were found to be readily soluble in a wide range of solvents and thus were excellent candidates for preparation of barium strontium titanate ((Ba,Sr)TiO3 or BST) thin films using spin-cast deposition techniques. The highest quality BST films for this system were generated from ternary mixtures dissolved in either pyridine or pyridine/toluene. By in situ VT-GIXRD analysis it was determined that the perovskite phase of BST was readily formed at 650°C. The electronic properties of films crystallized at 700°C indicated that the thin films (300 nm) possessed a dielectric constant of 120 (tan δ = 0.03) with a tunability of 29% at ±10 V. 300 nm films (700°C) which had been generated from a standard BST solution modified with a novel tridentate ligand, had a higher dielectric constant of 180 and a tunability of 35% at ±10 V. The collective characteristics of these precursors offer an attractive alternative to the more complex, less stable sol-gel precursors currently in use.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electroceramics 3 (1999), S. 163-172 
    ISSN: 1573-8663
    Keywords: chemical solution processing ; self-assembled monolayers ; microcontact printing ; PZT ; LiNbO3 ; Ta2O5.
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Integrated electroceramic thin-film devices on semiconducting or insulating substrate materials offer a wide variety of attractive attributes, including high capacitance density, nonvolatile memory, sensor/actuator ability, and other unique electrical, electromechanical, magnetic and optical functions. Thus the ability to pattern such electroceramic thin films is a critical technology for future device realization. Patterned oxide thin-film devices are typically formed by uniform film deposition followed by somewhat complicated post-deposition ion-beam or chemical etching in a controlled environment i.e., a subtractive method. We review here an upset technology, a different way of patterning, by an additive approach, which allows for the selective deposition of electroceramic thin layers without such post-deposition etching. In this method, substrate surfaces are selectively functionalized with hydrophobic self-assembled monolayers to modify the adhesion of subsequently deposited solution-derived electroceramics. The selective functionalization is achieved through microcontact printing (μ-CP) of self-assembled monolayers of the chemical octadecyltrichlorosilane on substrates of current technical interest. Subsequent sol-gel deposition of ceramic oxides on these functionalized substrates, followed by lift-off from the monolayer, yields high quality, patterned oxide thin layers only on the unfunctionalized regions. A variety of micron-scale dielectric oxide devices have been fabricated by this method, with lateral resolution as fine as 0.5 μm. In this paper, we review the monolayer patterning and electrical behavior of several patterned electroceramic thin films, including Pb(Zr,Ti)O3 [PZT], LiNbO3, and Ta2O5. A multilevel example is also given which combines selective MOCVD deposition of metal electrodes and sol-gel patterned PZT for Pt//PZT//Pt//Si(100) ferroelectric memory cells.
    Type of Medium: Electronic Resource
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