AIP Digital Archive
Electrical Engineering, Measurement and Control Technology
To study the x-ray laser beam deflection and divergence due to the refraction within the plasma, a specific diagnostic called CADIX has been developed at the Centre d'Etudes de Limeil-Valenton (CEL-V). When the beam refraction analysis is required a multilayer mirror is inserted on the x-ray laser output beam. It selects the lasing wavelengths and reflects them to an off-axis streak camera which records x rays as a function of time and angle. A detailed description of the instrument is presented including multilayer mirror calibration at the LURE (Laboratoire pour L'Utilisation du Rayonnement Synchrotron, Orsay, France). An experimental measurement on neon-like silver amplification is presented and analyzed with the response of the mirror. An important refraction effect is observed.
Type of Medium: