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  • 1
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Journal of Physics and Chemistry of Solids 23 (1962), S. 1613-1619 
    ISSN: 0022-3697
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Physics Letters 16 (1965), S. 8-11 
    ISSN: 0031-9163
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 14 (1979), S. 873-881 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Gold-titanium thin films are frequently used in a number of devices where gold is the conductor and titanium the bonding agent between gold and glass or ceramic substrates. Exposed to the corrosive environments, gold-titanium metallizations deteriorate and lead to failure of the devices. In this work, a preliminary study, the effect of humidity and temperature on interdiffusion of gold and titanium films was investigated. It was found that during the initial exposure period of gold-titanium thin film samples, the electrical resistance decreased. This decrease of electrical resistance occurs at temperatures as low as 70° C and can probably be ascribed to annealing processes in the samples. Exposure of the samples to higher temperatures results in the diffusion of titanium along the grain boundaries of the gold to the surface of the sample and in an increase of electrical resistance. It was observed that at 325° C titanium diffuses from grain boundaries into the gold grains and forms a gold-titanium alloy. An addition of the water vapour to the agron atmosphere does not noticeably affect the diffusion process. Optical microscope observations, of the titanium diffusion to the sample surface were confirmed by scanning electron microscopy and by X-ray fluoroscence counts in a scanning electron microscope.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 15 (1980), S. 42-52 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract In this study the effect of a small concentration of chlorine on gold-titanium metallization was investigated. Samples were prepared by deposition of gold and titanium layers on a glass substrate. Samples were exposed at 75, 135 and 175° C for 53 days to an argon atmosphere and to an argon atmosphere containing 50 ppm chlorine. In all cases the electrical resistance of the exposed samples decreased and the addition of chlorine made this decrease even larger. Depending on the conditions, migration of the titanium atoms and formation of preferred oriented structure took place. At 135 and 175° C in the argon atmosphere containing 50 ppm chlorine, a very active migration of titanium atoms from the gold layer to the external surface of the samples was observed. Migration of titanium was not observed in the samples exposed to the pure argon atmosphere. This strongly suggests that chlorine acts as an agent bringing titanium from the gold layer to the external surface by a process known as chemisorption-induced segregation; on the surface titanium forms an oxide. When samples were exposed for 53 days at 175° C, preferred oriented structure in the gold layer was developed. Formation of the preferred oriented structure was neither conditioned nor related to the presence of chlorine in the atmosphere.
    Type of Medium: Electronic Resource
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