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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Analytical chemistry 24 (1952), S. 1728-1732 
    ISSN: 1520-6882
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 72 (1968), S. 4450-4458 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 72 (1968), S. 4459-4467 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1520-4804
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 3951-3957 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Photoluminescence and Raman spectroscopy are employed to explore the time evolution of defect formation in chemical vapor deposition diamond films for stages of growth spanning nucleation to continuous film formation. Our research is concentrated on three types of defects which give rise to the 1.68 eV optical band, the sp2 phase which centers at 1500 cm−1, and the broadband luminescence at 565–800 nm. The investigation of these types of defects suggests the following conclusions. Si atoms are most likely responsible for the creation of the 1.68 eV optical centers which takes place at the initial stages of growth. Plasma interactions with the Si substrate contribute to the 1.68 eV defect formation. The broad luminescence and sp2 bonding defects were not present in the isolated nuclei but were significantly present when a continuous film was formed. Two rates of diamond growth were obtained and the changes of the rates were attributed to the lowering degree of freedom available for the growth of the nuclei as well as to the formation of the sp2 phase.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 835-842 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Schottky barrier formation of metal contacts deposited on diamond (111) and (100) surfaces was investigated. Three different metals (Au, Al, and Ti) were studied because of their different chemical reactivity with C, i.e., Au being a nonreactive metal, Al a weak carbide-forming metal, and Ti a strong carbide former. Both fully H-terminated, unreconstruted (1×1) surfaces and H-desorbed, reconstructed (2×2)/(2×1) surfaces with higher density of surface states were examined. Surface structures were determined via low-energy electron diffraction, and the change of surface band bending (SBB) and the interface chemistry during the contact formation were monitored using x-ray photoelectron spectroscopy. On the reconstructed surfaces, the SBB was independent of metal thicknesses. This was attributed primarily to Fermi-level pinning by the high density of surface states on the reconstructed surfaces. On the other hand, the surface-state densities were much lower on the unreconstructed surfaces and thus the Fermi level was not as strongly pinned as that on the reconstructed surfaces. When the metal coverage became large ((approximately-greater-than)0.5 monolayer) on these unreconstructed surfaces, the charge transferred from the metal contacts to the diamond, the Fermi level moved upward in the band gap and the SBB increased. However, even on the unreconstructed surfaces where the density of pinning states were low, the SBB for thick metal contacts did not correlate to metal properties such as work function and/or electronegativity. Regardless of the state of the diamond surfaces, it was also important to consider the interface chemistry (chemical reactivity of the metal on diamond) to understand the change of the SBB after annealing the metal contacts.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 6400-6405 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The surface topography of silicon substrates after the initial stages of diamond growth, by microwave plasma enhanced chemical vapor deposition, has been observed by scanning tunneling microscopy. The initial surfaces were polished with diamond paste before deposition to enhance nucleation, and the scratches were examined. After one half hour growth, the surface showed additional topography over all regions, and widely spaced faceted structures were detected which were attributed to diamond nuclei. The surface between nuclei showed increased roughness with increased deposition time. The faceted nuclei were found along the scratches. The nuclei showed facets which were smooth to within 5 A(ring). Fingerlike ridge structures were found extending from and in-between some of the nuclei. These structures indicate a mechanism of the lateral diamond growth. The electronic properties of the surface were probed by local I-V measurements, and characteristics attributable to SiC were observed.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 5912-5918 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The results of in vacuo x-ray photoelectron spectroscopy and Auger electron spectroscopy of Al-diamond interfaces for Al overlayer thicknesses up to 10 A(ring) are presented. Postdeposition annealing effects up to 430 °C are also discussed. Ex situ current-voltage (I-V) measurements were also made on thick (∼1500 A(ring)) Al contacts on diamonds. The as-grown diamond surface, on which Al was a rectifying contact, did not chemically interact with Al, even after annealing. An Ar+-sputtered diamond surface, on the other hand, did react with Al to form Al—C bonds upon annealing at temperatures as low as 430 °C. Al on the sputtered surface resulted in an ohmic contact. The distortion of the diamond network and formation of vacancies and unsatisfied bonds via Ar+ sputtering of the diamond surface change the I-V characteristics of the Al contact and also facilitate the solid state interdiffusion of Al and C as well as interface reactions at elevated temperatures.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 2679-2681 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report the methods and results of a theoretical study of the diamond-cubic boron nitride [BNcub] heteroepitaxial system. We introduce a general, geometric reciprocal space technique for evaluating candidate epitaxial configurations, and a novel system of essentially geometric criteria to order them from most to least likely to occur. In the diamond- BNcub system, it is found that low index like planes require a relatively small strain of 1.37% from bulk parameters. The unlike epitaxial configuration which pairs diamond{100} with BNcub{221} and yields two-dimensional coincidence with the same strain is favored above other low index mixed configurations. The essentially geometric nature of this epitaxial system is highlighted.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 3142-3148 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Crystal/material quality and electrical properties of B-doped diamond films synthesized by microwave plasma chemical vapor deposition were investigated. Raman spectroscopy verified the presence of diamond and indicated that the crystal quality increased with B doping. Secondary-ion mass spectroscopy showed that the B/C ratios in the films were larger than the B/C ratios in the gas phase, possibly due to differences in B and C sticking coefficients. Electrode patterns of Pt were fabricated on the films and electrical properties were investigated. On undoped diamond films with a residual B concentration of ∼5×1017 cm−3, these contacts were rectifying with small reverse leakage currents and on B-doped diamond films with a B concentration of 200 and 400 ppm, they yielded ohmic behavior. The temperature dependence of the resistivity showed that these doped films had activation energies, an order of magnitude smaller than that associated with the B impurity level in diamonds. The small activation energies associated with these heavily doped films suggest that an impurity band conduction plays an important role. Experimentally determined Hall mobility of the films was also interpreted qualitatively by an impurity band conduction mechanism and effects of grain boundaries and sp2 components on the transport properties are considered to be small for heavily doped films.
    Type of Medium: Electronic Resource
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