International Union of Crystallography (IUCr)
Applied crystallography online
27 (1994), S. 907-911
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Anomalous small-angle X-ray scattering (ASAXS) was employed to analyze CdSxSe1 − x-doped silicate glasses, x = 0.4 and 0.6. From the intensity variations, as measured for four X-ray energies near the K-absorption edge of Se and at 9.5 keV, reliable values for the ratio of molecular densities in the crystalline CdSxSe1 − x phase and the surrounding amorphous matrix were found. Combination of this with the integrated intensity yields values for the CdSxSe1 − x volume fraction of 0.7 to 3%. Mean particle radii between 5 and 7 nm and number densities in the range 1 to 8 × 1016 cm−3 were obtained from fitted Gaussian and log-normal size distributions, respectively.
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