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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Archives of microbiology 152 (1989), S. 420-424 
    ISSN: 1432-072X
    Keywords: Bdellovibrio bacteriovorus ; Unbalanced growth ; Growth kinetics ; Bacterial DNA replication
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology
    Notes: Abstract In this study we have investigated the rates and spatial patterns of chromosome replication and cell elongation during the growth phase of wild-type and facultatively prey-independent mutant strains of Bdellovibrio bacteriovorus. For the facultatively prey-independent mutants, the total DNA content of synchronously growing cultures was found to increase exponentially, as the multiple chromosomes within each filamentous cell replicated simultaneously. Cell mass, measured as total cellular protein, also increased exponentially during this period, apparently by means of multiple elongation sites along the filament wall. The relative rates of DNA and protein synthesis were unbalanced during growth, however, with the cellular concentration of DNA increasing slightly faster than that of protein. The original cellular DNA: protein ratio was restored in the progeny cells by continued protein synthesis during the septation period that follows the termination of DNA replication. Because of technical problems, these experiments could not be conducted on the wild-type cells, but similar results are assumed. This unusual pattern of unbalanced growth may represent an adaptation by bdellovibrios to maximize their progeny yield from the determinate amount of substrate available within a given prey cell.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 116 (2002), S. 3058-3062 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: For a critical binary liquid mixture where the surface tension difference between the two components is very large, the component with the lowest surface tension completely saturates the liquid-vapor surface. The variation in the local volume fraction v(z), with depth z into the liquid mixture, is described by a universal surface scaling function P±≡P±(z/ξ±), which takes differing forms in the one- (+) and two-phase (−) regions, where ξ represents the bulk correlation length. Carpenter et al. [Phys. Rev. E 59, 5655 (1999); 61, 532 (2000)] determined P± using the ellipsometric critical adsorption data of four different critical binary liquid mixtures. A deficiency of this prior study was that each of the liquid mixtures possessed at least one polar component, which could have generated distortions in the function P±(z/ξ±). In this publication, we demonstrate that P±, determined in the previous study, provides an excellent description of the nonpolar critical binary liquid mixture 1,1,2,2-tetrabromoethane+n-dodecane. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Annals of the New York Academy of Sciences 124 (1965), S. 0 
    ISSN: 1749-6632
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Natural Sciences in General
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Biochemical and Biophysical Research Communications 48 (1972), S. 1019-1024 
    ISSN: 0006-291X
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Biology , Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 258-261 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A scaling relationship has been discovered between the sputtering rate and the partial pressure of argon PAr, which leaves the superconducting properties of NbN films invariant. As PAr increases for a given sputtering rate, there is a linear reduction of Tc together with a rapid increase, followed eventually by saturation, in Hc2 at 4.2 K. These produce a maximum in Jc (measured at 19 T and 4.2 K) at a particular value of PAr. Films exhibiting nearly the same set of superconducting properties and microstructures can be made at a higher fixed sputtering rate if the values of PAr are multiplied by a constant scale factor. This scaling relation is found to hold for two separate sputtering systems, one of which uses a standard diffusion pump while the other uses an oilless turbo pump. Additional comparisons with the results of others reinforces the conclusion that the scaling relationship is universal and thus may provide some insight into those factors in the sputtering process which are important for determining the superconducting properties and microstructure of sputtered NbN films.
    Type of Medium: Electronic Resource
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  • 6
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Superconducting films of Bi2Sr2CaCu2Ox have been fabricated on single-crystal MgO substrates by a low-temperature in situ process. Using a substrate temperature Ts≈645 °C, metallic films with a superconducting onset of 90–100 K and an extrapolated Tc0=56 K have been obtained. X-ray diffraction shows the films to be c-axis oriented. Electron microscopy reveals that the films are not significantly smoother than films which were post-annealed at 865 °C, and that some segregation into nonsuperconducting phases had occurred. The exact mechanism by which crystallization and superconductivity occurs at such low temperatures is not yet known, but it can be speculated that the surface atoms are less constrained and thus have a smaller energy barrier to overcome in forming a crystal structure.
    Type of Medium: Electronic Resource
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  • 7
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using a specially designed off-axis faced magnetron sputtering chamber we have performed in situ x-ray diffraction studies of the growth of YBa2Cu3Ox films using a synchrotron light source. The orientation and rocking curve width were studied as a function of substrate temperature, O2/Ar partial pressures, and deposition rate. Growth rate was studied on SrTiO3, LaAlO3, and MgO.
    Type of Medium: Electronic Resource
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  • 8
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: X-ray diffraction was performed in situ during annealing of a Co/Ti/Si(001) multilayer, which produced an epitaxial CoSi2 layer. The results indicate that the Ti layer did not stay intact during the reaction, and thus could not act like a membrane, moderating Co/Si interdiffusion. Strongly textured phases (M) formed prior to CoSi2 nucleation, and was unobservable upon completion of the anneal. Nucleation and growth of CoSi2 on Si(001) took place in the presence of M, new Co-Ti-(O) phases that were located at the metal/Si interface, and thus M might play an important role in the perfection of the silicide. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 8163-8167 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The temperature dependence of the penetration depth of Nb films was determined from resistive transitions of Nb/AlOx/Nb Josephson junctions in a constant magnetic field applied parallel to the junction planes. Distinct resistance peaks were observed as temperature decreases and those peaks were found to appear when the total flux threading the junction equals an integral multiple of the flux quantum. From this condition, the penetration depth at those peak positions has been determined. The temperature dependence was well described by either the dirty local limit or the two-fluid model. This method can be useful for a highly fluctuating system such as high-temperature superconductors.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 53 (1988), S. 2560-2562 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The upper critical field Bc2 provides the most direct measure of the intrinsic anisotropy of a superconductor. For highly oriented, sputtered thin films of the high-temperature superconductor Tl2Ba2CaCu2Ox, we find a Bc2 anisotropy of at least 70, which exceeds similar measurements on thin films and single crystals of the high-temperature superconductors Bi-Sr-Ca-Cu-O and YBa2Cu3Oy. We discuss why the midpoints of the resistive transitions, used in these measurements, may be appropriate for defining the intrinsic Bc2.
    Type of Medium: Electronic Resource
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