ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Thin films of giant magnetostrictive materials were formed by dc magnetron sputtering and ion beam sputtering processes. A systematic investigation was made to examine the effect of these deposition processes on the magnetic properties and magnetostriction of TbFe2 and (Tb, Dy)Fe2 thin films. The magnetostriction of the films formed by dc sputtering was in the range from 200 to 400 ppm at a magnetic field H=15 kOe, whereas the films formed by the ion beam sputtering exhibited a slightly higher magnetostriction. For both processes, the increase in Ar partial pressure in the deposition processes strongly changed magnetic anisotropy from perpendicular to in plane, and increased magnetostriction and magnetostrictive response at low magnetic fields. However, the mixture of Xe gas into Ar gas in the dc sputtering lowered magnetization and gave almost no effect on magnetic anisotropy. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1150370
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