ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A direct fast-chopped beam extracted from a surface-plasma H− ion source is proposed and a preliminary test has been examined. The converter bias voltage is modulated by rf pulses and the extracted H− beam is observed. The direct fast-chopped H− beam extracted from the ion source has a good response to the modulation of the converter bias voltage, as expected. The chopped H− beam extracted by this method has been injected into the 500 MeV booster synchrotron at KEK-PS. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1146754
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