Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
64 (1988), S. 5781-5784
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We have observed finite size effects in thin films (20 A(ring)〈L〈1000 A(ring)) of CuMn with concentrations of 4%, 7%, and 13.5% Mn. In order to have measurable magnetization the samples are produced in the form of multilayers with silicon or copper interlayers. The interlayers are sufficiently thick (tSi =70 A(ring); tCu =300 A(ring)) so that there are no observable interactions between the CuMn layers. The samples are characterized structurally by low-angle x-ray diffraction, imaging, and x-ray fluorescence using a scanning transmission electron microscope. The metallic films are also characterized by measuring the electrical resistivity of both multilayer and single-layer CuMn samples. The temperature Tg of the peak in the dc susceptibility shifts with film thickness L as (T0g−Tg)/T0g∼L−λ for all concentrations and for both Si and Cu interlayers. The results for 4% Mn will be discussed in detail and compared with previously published data on 7% Mn.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.342229
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