ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We have started a new project, in which we have utilized an electron cyclotron resonance ion source (ECRIS) and a heavy ion linac for trace element analysis. This combination is expected to identify many kinds of trace elements simultaneously with very low background [very low detection limits (sub-pg/g) were attained by this method] without the pretreatment of a sample. This system is also applicable to fast neutron radiography, because it is possible to produce intense fast neutron beams. When we produce 100 μA of a Li beam from the ECRIS and use the nuclear reaction of H(Li,n)B at ∼2 MeV/u for production of neutrons, we can easily produce an intense focused fast neutron beam (∼2 MeV, 1010 particles/s). It has great advantages for neutron radiography. (1) We can minimize the background of the neutrons and gamma rays produced by the neutron-induced reaction, because the neutrons are emitted just at a forward angle. (2) Intense fast neutron beams can be easily produced. This kind of beam is very useful for fast neutron radiography. In this article, we present the experimental results of trace element analysis of several ceramic rods. We also present the basic idea of fast neutron radiography using this system and the planned experiment in detail. © 2002 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1432467
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