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  • 1
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 100 (1994), S. 5726-5734 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Mobilities of He+, Ne+, Ar+, and Kr+ have been measured in He gas at 4.35 K. An injected-ion drift tube which can be cooled by liquid helium was used. It has a Wien filter on the ion injection line and a quadrupole mass filter on the detection line so that mass identification is explicitly made. Ions are injected into the drift tube with 20 eV, and it is assured that the thermalization of ions is completed well before reaching the gate for mobility measurement. The correction for thermal transpiration in the pressure measurement was made by Takaishi–Sensui's empirical formula. The reduced mobility K was measured against E/N, where E is the electric field strength and N is the gas number density. Then the E/N was converted to the effective temperature Teff by Wannier's formula. The K(Teff) obtained are compared with the previous experimental and theoretical results, some of which are given in K0(Tg), where K0 is the zero field mobility and Tg is the gas temperature. The agreement between the present results and the previous experimental results is generally good at high temperature where they are available. Recommended numerical values are presented.The present work confirms the findings in the preliminary report by Kojima et al. that the K of He+ in He has a maximum around E/N=5 Td which corresponds to Teff=18 K, and it decreases steeply below that temperature. An apprehension that the structure might be caused by clustering is discussed and denied. The maximum found in K of He+ in He is considered to be the structure predicted theoretically as a result of orbiting resonance scattering. The Ks obtained for Ne+, Ar+, and Kr+ have a typical shape of mobilities in heterogeneous gas. They have a maximum around Teff=500–1000 K and become more or less flat below 50 K. From the maximum position the well depths of the interaction potentials are estimated and compared with theoretical calculations. There is a shallow minimum of K between 50 and 100 K for Ar+ and Kr+. The Ks at the flat are a few percent larger than the polarization limit Kpol. Below Teff=6 K, Ks tend to decrease steeply. This steep decrease of K is also suggested to be an orbiting resonance scattering effect although no theoretical calculation is available.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 5 (1998), S. 1058-1060 
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Photon–ion merged-beam apparatus using a compact ECR ion source and a high-brilliance light source has been designed for the study of photoabsorption processes of multiply charged ions. Photoion spectroscopy will be performed along isoelectronic, isonuclear and isoionic sequences. The main features of this apparatus are described.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 22 (1992), S. 645-650 
    ISSN: 1434-6079
    Keywords: 36.40.+d ; 35.20.Wg
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Rare gas ions Ne+, Ar+ and Kr+ are injected into a drift tube which is filled with helium gas and cooled by liquid helium. Helium cluster ions RgHe x + (Rg=Ne, Ar and Kr,x≦14) are observed as products. Information regarding the stability of RgHe x + is obtained from drift field dependence of the size distribution of the clusters, and magic numbers are determined. The magic numbers arex=11 and 13 for NeHe x + andx=12 for ArHe x + and KrHe x + . NeHe x + , Ar+ and Kr+ are proposed as the core ions for NeHe 13 + , ArHe 12 + and KrHe 12 + , respectively.
    Type of Medium: Electronic Resource
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