ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
A Standard technique for measuring window absorption and other efficiency losses in semiconductor X-ray spectrometers is described. This technique is in the process of being adopted as an IEEE and IEC standard. A NBS standard reference material glass, SRM-477, has been developed to promote broad availability for the standard method throughout the user community. Measurements are reported which have been made to establish limits on the geometry of the technique and to determine the effectiveness of the method.
Additional Material:
10 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300100212
Permalink