ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We have studied the variation of the strain and the magnetic moment in epitaxial fct Ni(001) film structures using a combination of reflection high energy electron diffraction (RHEED) and x-ray magnetic circular dichroism. A 30 Å Cu/Ni step-wedge (30, 60, 90, and 150 Å)/600 Å Cu buffer/Si(001) structure has been used to study the Ni thickness-dependent strain and magnetic moment. A decreased magnetic moment with decreasing Ni thickness is observed. A 30 Å Cu/50 Å Ni/step-wedged (600, 1000, 1500, and 2000 Å) Cu buffer/Si(001) was used to vary the degree of strain as determined by in situ RHEED measurements in the same Ni film by varying the Cu buffer layer thickness. Our study shows a possible correlation between the magnetic moment and strain. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.365059
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