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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 846-846 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Recently we have demonstrated that InP:Fe photoconductors are fast (FWHM∼150 ps), sensitive (2.7×10−3 A/W), and flat response soft x-ray detectors using synchrotron radiation from the Stanford Synchrotron Radiation Laboratory.1 We have applied these to the measurement of the radiation emitted by a collapsing annular gas (argon) puff z-pinch plasma. The detector was used in two modes of operation: (1) a filtered soft x-ray detector as a pinch diagnostic and (2) a fast unfiltered bolometer to measure the total radiated power as a function of time. We will compare the performance of the photoconductors to other common fast x-ray detectors and bolometers.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 937-937 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The shape and absolute intensity of the infrared emission as a function of wavelength can yield information about the conditions in a plasma. This diagnostic technique has been reviewed by Zwicker,1 who gives several examples of its application to low density plasmas. We have applied this diagnostic, for the first time, to a high density (∼1020 cm−3) plasma, a collapsing gas (argon) shell Z pinch. Using a fast Au doped Ge detector and infrared notch filters we have scanned the emitted spectrum from ∼0.5 to 8.2 μm with l-ns time resolution. This spectral range encompasses the optically thin-to-thick transition as well as the plasma frequency at the time of peak compression. We will present this data along with an interpretation which allows us to follow the development of the pinched column during the thermalization stage.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 58 (1985), S. 1711-1714 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A technique for calibrating an x-ray streak camera in situ has been developed. It has been applied to an x-ray streak camera installed on a collapsing gas shell Z-pinch. The calibration was done by simultaneously measuring the emitted x-rays using a pinhole camera, an InP:Fe photoconductive detector, and the streak camera. The spatial dimension of the streak image was calibrated by integrating the film density over time and fitting the resulting data to the corresponding information taken from an x-ray pinhole image. The temporal calibration was obtained by similarly fitting the film density from the x-ray streak image as a function of time integrated over the appropriate part of the spatial dimension with the signal from an InP:Fe photoconductive detector. By using this technique we have found a spatial magnification of the streak camera system consistent with the results derived from the geometrical optics to within 10%. A temporal dispersion of 2.5±0.5 ns/mm was obtained, which is in agreement with the nominal speed of 2.5 ns/mm. This technique also yielded an absolute intensity calibration of the streak camera.
    Type of Medium: Electronic Resource
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